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IDT54FCT273CSOB Datasheet(PDF) 2 Page - Integrated Device Technology |
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IDT54FCT273CSOB Datasheet(HTML) 2 Page - Integrated Device Technology |
2 / 7 page 7.10 2 IDT54/74FCT273/A/C FAST CMOS OCTAL D FLIP-FLOP WITH MASTER RESET MILITARY AND COMMERCIAL TEMPERATURE RANGES FUNCTION TABLE Inputs Outputs Operating Mode MR MR CP DN ON Reset (Clear) L X X L Load “1” H ↑ hH Load “0” H ↑ lL NOTES: 2558 tbl 06 H = HIGH voltage level steady-state h = HIGH voltage level one set-up time prior to the LOW-to-HIGH clock transition L = LOW voltage level steady state l = LOW voltage level one set-up time prior to the LOW-to-HIGH clock transition X = Don’t care ↑ = LOW-to-HIGH clock transition PIN DESCRIPTION Pin Names Description DN Data Input MR Master Reset (Active LOW) CP Clock Pulse Input (Active Rising Edge) ON Data Outputs 2558 tbl 05 ABSOLUTE MAXIMUM RATINGS (1) Symbol Rating Commercial Military Unit VTERM (2) Terminal Voltage –0.5 to +7.0 –0.5 to +7.0 V with Respect to GND VTERM (3) Terminal Voltage –0.5 to VCC –0.5 to VCC V with Respect to GND TA Operating 0 to +70 –55 to +125 °C Temperature TBIAS Temperature –55 to +125 –65 to +135 °C Under Bias TSTG Storage –55 to +125 –65 to +150 °C Temperature PT Power Dissipation 0.5 0.5 W IOUT DC Output Current 120 120 mA NOTES: 2558 tbl 01 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed VCC by +0.5V unless otherwise noted. 2. Input and VCC terminals only. 3. Outputs and I/O terminals only. CAPACITANCE (TA = +25 °C, f = 1.0MHz) Symbol Parameter (1) Conditions Typ. Max. Unit CIN Input Capacitance VIN = 0V 6 10 pF COUT Output Capacitance VOUT = 0V 8 12 pF NOTE: 2558 tbl 02 1. This parameter is guaranteed by characterization data and not tested. |
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