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IDT74FCT377T Datasheet(PDF) 3 Page - Integrated Device Technology

Part No. IDT74FCT377T
Description  FAST CMOS OCTAL D FLIP-FLOP WITH CLOCK ENABLE
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Maker  IDT [Integrated Device Technology]
Homepage  http://www.idt.com
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IDT74FCT377T Datasheet(HTML) 3 Page - Integrated Device Technology

   
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IDT54/74FCT377T/AT/CT/DT
FAST CMOS OCTAL D FLIP-FLOP WITH CLOCK ENABLE
MILITARY AND COMMERCIAL TEMPERATURE RANGES
6.14
3
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Commercial: TA = 0
°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol
Parameter
Test Conditions
(1)
Min.
Typ.
(2)
Max.
Unit
VIH
Input HIGH Level
Guaranteed Logic HIGH Level
2.0
V
VIL
Input LOW Level
Guaranteed Logic LOW Level
0.8
V
IIH
Input HIGH Current
(4)
VCC = Max.
VI = 2.7V
±1
µA
IIL
Input LOW Current
(4)
VCC = Max.
VI = 0.5V
±1
µA
II
Input HIGH Current
(4)
VCC = Max., VI = VCC (Max.)
±1
µA
VIK
Clamp Diode Voltage
VCC = Min., IN = –18mA
–0.7
–1.2
V
IOS
Short Circuit Current
VCC = Max.
(3), VO = GND
–60
–120
–225
mA
VOH
Output HIGH Voltage
VCC = Min.
IOH = –6mA MIL.
2.4
3.3
V
VIN = VIH or VIL
IOH = –8mA COM’L.
IOH = –12mA MIL.
2.0
3.0
V
IOH = –15mA COM’L.
VOL
Output LOW Voltage
VCC = Min.
IOL = 32mA MIL.
0.3
0.5
V
VIN = VIH or VIL
IOL = 48mA COM’L.
IOFF
Input/Output Power Off
VCC = 0V, VIN or VO
≤ 4.5V
±1
µA
Leakage
(5)
VH
Input Hysteresis
200
mV
ICC
Quiescent Power
VCC = Max.
0.01
1
mA
Supply Current
VIN = GND or VCC
NOTES:
2630 tbl 05
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25
°C ambient.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. The test limit for this parameter is
±5µA at TA = -55°C.
5. This parameter is guaranted but not tested.


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