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IDT74FCT138AL Datasheet(PDF) 3 Page - Integrated Device Technology |
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IDT74FCT138AL Datasheet(HTML) 3 Page - Integrated Device Technology |
3 / 6 page IDT54/74FCT138/A/C FAST CMOS 1-OF-8 DECODER-WITH ENABLE MILITARY AND COMMERCIAL TEMPERATURE RANGES 7.3 3 POWER SUPPLY CHARACTERISTICS VLC = 0.2V; VHC = VCC – 0.2V Symbol Parameter Test Conditions (1) Min. Typ. (2) Max. Unit ICC Quiescent Power Supply Current Vcc = Max. — 0.2 1.5 mA VIN ≥ VHC; VIN ≤ VLC ∆ICC Quiescent Power Supply Current Vcc = Max. — 0.5 2.0 mA TTL Inputs HIGH VIN = 3.4V (3) ICCD Dynamic Power Supply Current (4) Vcc = Max. VIN ≥ VHC — 0.15 0.3 mA/MHz Outputs Open VIN ≤ VLC One Output Toggling 50% Duty Cycle IC Total Power Supply Current (5) Vcc = Max. VIN ≥ VHC — 1.7 4.5 mA Outputs Open VIN ≤ VLC Toggle E1, E2 or E3 (FCT) 50% Duty Cycle VIN = 3.4V — 2.0 5.5 fO = 10MHz VIN = GND One Output Toggling NOTES: 2581 tbl 04 1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25 °C ambient. 3. Per TTL driven input (VIN = 3.4V); all other inputs at VCC or GND. 4. This parameter is not directly testable, but is derived for use in Total Power Supply calculations. 5. IC = IQUIESCENT + IINPUTS + IDYNAMIC IC = ICC + ∆ICC DHNT + ICCD (fCP/2 + fONO) ICC = Quiescent Current ∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V) DH = Duty Cycle for TTL Inputs High NT = Number of TTL Inputs at DH ICCD = Dynamic Current Caused by an Output Transition Pair (HLH or LHL) fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices) fO = Output Frequency NO = Number of Outputs at fO All currents are in milliamps and all frequencies are in megahertz. DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC – 0.2V Commercial: TA = 0 °C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10% Symbol Parameter Test Conditions (1) Min. Typ. (2) Max. Unit VIH Input HIGH Level Guaranteed Logic HIGH Level 2.0 — — V VIL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V IIH Input HIGH Current VCC = Max. VI = VCC —— 5 µA VI= 2.7V — — 5 (4) IIL Input LOW Current VI= 0.5V — — –5 (4) VI = GND — — –5 VIK Clamp Diode Voltage VCC = Min., IN = –18mA — –0.7 –1.2 V IOS Short Circuit Current VCC = Max. (3), VO = GND –60 –120 — mA VOH Output HIGH Voltage VCC = 3V, VIN = VLC or VHC, IOH = –32 µAVHC VCC —V VCC = Min. IOH = –300 µAVHC VCC — VIN = VIH or VIL IOH = –12mA MIL. 2.4 4.3 — IOH = –15mA COM’L. 2.4 4.3 — VOL Output LOW Voltage VCC = 3V, VIN = VLC or VHC, IOL = 300 µA — GND VLC V VCC = Min. IOL = 300 µA — GND VLC (4) VIN = VIH or VIL IOL = 32mA MIL. — 0.3 0.5 IOL = 48mA COM’L. — 0.3 0.5 NOTES: 2581 tbl 03 1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25 °C ambient and maximum loading. 3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second. 4. This parameter is guaranteed but not tested. |
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