5.5

3

IDT54/74FCT162H272AT/CT/ET

FAST CMOS 12-BIT SYNCHRONOUS TRI-PORT BUS EXCHANGER

MILITARY AND COMMERCIAL TEMPERATURES RANGES

NOTES:

1. Output level before the indicated steady-state input conditions were

established.

2. H = HIGH Voltage Level

L = LOW Voltage Level

X = Don't Care

Z = High Impedance

↑ = LOW-to-HIGH Transition

ABSOLUTE MAXIMUM RATINGS

(1)

FUNCTION TABLES

(2)

3071 tbl 04

3071 tbl 05

NOTES:

1. On FCT162H272T these pins have "Bus Hold". All other pins are standard inputs, outputs or I/Os.

PIN DESCRIPTION

Signal

I/O

Description

I/O

I/O

I/O

CLK

I

Clock Input.

CEA1B

I

Clock Enable Input for the A-1B Register. If

CEA1B is LOW during the rising edge of CLK, data will be clocked

into register A-1B (Active LOW).

CEA2B

I

Clock Enable Input for the A-2B Register. If

CEA2B is LOW during the rising edge of CLK, data will be clocked

into register A-2B (Active LOW).

CE1B

I

Clock Enable Input for the 1B-A Register. If

CE1B is LOW during the rising edge of CLK, data will be clocked into

register 1B-A (Active LOW).

CE2B

I

Clock Enable Input for the 2B-A Register. If

CE2B is LOW during the rising edge of CLK, data will be clocked into

register 2B-A (Active LOW).

SEL

I

1B or 2B Path Selection. When HIGH during the rising edge of CLK, SEL enables data transfer from 1B Port to

A Port. When LOW during the rising edge of CLK, SEL enables data transfer from 2B Port to A Port.

OEA

I

Synchronous Output Enable for A Port (Active LOW).

OEB

I

Synchronous Output Enable for 1B Port and 2B Port (Active LOW).

3071 tbl 01

Inputs

Output

1B

2B

SEL

CE1B

CE1B CE2B

CE2B OEA

OEA

CLK

A

HX

H

L

X

L

↑

H

LX

H

L

X

L

↑

L

X

X

HHX

L

↑

XH

L

X

L

L

↑

H

XL

L

X

LL

↑

L

XX

L

X

H

L

↑

X

XXXXH

↑

Z

Inputs

Outputs

A

CEA1B

CEA1B CEA2B

CEA2B

OEB

OEB

CLK

1B

2B

HL

L

L

↑

HH

LLL

L

↑

LL

HL

H

L

↑

LLH

L

↑

HHL

L

↑

H

LH

L

L

↑

L

XH

H

L

↑

XXX

H

↑

ZZ

XXX

L

↑

Active

Active

Symbol

Description

Max.

Unit

GND

–0.5 to +7.0

V

GND

–0.5 to

V

Storage Temperature

–65 to +150

°C

DC Output Current

–60 to +120

mA

NOTES:

1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT-

INGS may cause permanent damage to the device. This is a stress rating

only and functional operation of the device at these or any other condi-

tions above those indicated in the operational sections of this specifica-

tion is not implied. Exposure to absolute maximum rating conditions for

extended periods may affect reliability.

2. All device terminals except FCT162XXXT Output and I/O terminals.

3. Output and I/O terminals for FCT162XXXT.

3071 tbl 02

NOTE:

1. This parameter is measured at characterization but not tested.

3071 tbl 03

Symbol

Conditions

Typ.

Max.

Unit

Input

Capacitance

3.5

6.0

pF

I/O

Capacitance

3.5

8.0

pF