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IDT54FCT162511ATPV Datasheet(PDF) 1 Page - Integrated Device Technology |
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IDT54FCT162511ATPV Datasheet(HTML) 1 Page - Integrated Device Technology |
1 / 11 page MILITARY AND COMMERCIAL TEMPERATURE RANGES AUGUST 1996 ©1996 Integrated Device Technology, Inc. 5.11 DSC–2916/5 Integrated Device Technology, Inc. The IDT logo is a registered trademark of Integrated Device Technology, Inc. FAST CMOS 16-BIT REGISTERED/LATCHED TRANSCEIVER WITH PARITY IDT54/74FCT162511AT/CT FEATURES: • 0.5 MICRON CMOS Technology • Typical tsk(o) (Output Skew) < 250ps, clocked mode • Low input and output leakage ≤1µA (max) • ESD > 2000V per MIL-STD-883, Method 3015; > 200V using machine model (C = 200pF, R = 0) • Packages include 25 mil pitch SSOP, 19.6 mil pitch TSSOP, 15.7 mil pitch TVSOP and 25 mil pitch Cerpack • Extended commercial range of –40 °C to +85°C •VCC = 5V ±10% • Balanced Output Drivers: ±24mA (commercial) ±16mA (military) • Series current limiting resistors • Generate/Check, Check/Check modes • Open drain parity error allows wire-OR DESCRIPTION: The FCT162511AT/CT 16-bit registered/latched transceiver with parity is built using advanced dual metal CMOS technol- ogy. This high-speed, low-power transceiver combines D- type latches and D-type flip-flops to allow data flow in transpar- ent, latched or clocked modes. The device has a parity generator/cheker in the A-to-B direction and a parity checker in the B-to-A direction. Error checking is done at the byte level with separate parity bits for each byte. Separate error flags exits for each direction with a single error flag indicating an error for either byte in the A-to-B direction and a second error flag indicating an error for either byte in the B-to-A direction. The parity error flags are open drain outputs which can be tied together and/or tied with flags from other devices to form a single error flag or interrupt. The parity error flags are enabled by the OExx control pins allowing the designer to disable the error flag during combinational transitions. The control pins LEAB, CLKAB and OEAB control opera- tion in the A-to-B direction while LEBA, CLKBA and OEBA control the B-to-A direction. GEN/CHK is only for the selection of A-to-B operation, the B-to-A direction is always in checking mode. The ODD/ EVEN select is common between the two directions. Except for the ODD/ EVEN control, independent operation can be achieved between the two directions by using the corresponding control lines. SIMPLIFIED FUNCTIONAL BLOCK DIAGRAM: GEN/CHK Latch/ Register Byte Parity Generator/ Checker Latch/ Register Byte Parity Checking B0-15 A0-15 PA1,2 PB1,2 PERB LEAB CLKAB OEAB OEBA PERA LEBA CLKBA Parity, data Parity, data Parity, Data Data (Open Drain) (Open Drain) Parity ODD/EVEN 16 18 18 18 2 2916 drw 01 1 |
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