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IDT7026L35JB Datasheet(PDF) 7 Page - Integrated Device Technology |
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IDT7026L35JB Datasheet(HTML) 7 Page - Integrated Device Technology |
7 / 18 page IDT7026S/L HIGH-SPEED 16K x 16 DUAL-PORT STATIC RAM MILITARY AND COMMERCIAL TEMPERATURE RANGES 6.17 7 IDT7026X35 IDT7026X55 Symbol Parameter Min. Max. Min. Max. Unit READ CYCLE tRC Read Cycle Time 35 — 55 — ns tAA Address Access Time — 35 — 55 ns tACE Chip Enable Access Time (3) —35—55 ns tABE Byte Enable Access Time (3) —35—55 ns tAOE Output Enable Access Time — 20 — 30 ns tOH Output Hold from Address Change 3 — 3 — ns tLZ Output Low-Z Time (1, 2) 3— 3— ns tHZ Output High-Z Time (1, 2) —15—25 ns tPU Chip Enable to Power Up Time (2) 0— 0— ns tPD Chip Disable to Power Down Time (2) —35—50 ns tSOP Semaphore Flag Update Pulse ( OE or SEM)15 — 15 — ns tSAA Semaphore Address Access Time — 35 — 55 ns AC TEST CONDITIONS Input Pulse Levels GND to 3.0V Input Rise/Fall Times 5ns Max. Input Timing Reference Levels 1.5V Output Reference Levels 1.5V Output Load Figures 1 and 2 2939 tbl 11 AC ELECTRICAL CHARACTERISTICS OVER THE OPERATING TEMPERATURE AND SUPPLY VOLTAGE RANGE(4) IDT7026X20 IDT7026X25 Com'l. Only Symbol Parameter Min. Max. Min. Max. Unit READ CYCLE tRC Read Cycle Time 20 — 25 — ns tAA Address Access Time — 20 — 25 ns tACE Chip Enable Access Time (3) —20—25 ns tABE Byte Enable Access Time (3) —20—25 ns tAOE Output Enable Access Time — 12 — 13 ns tOH Output Hold from Address Change 3 — 3 — ns tLZ Output Low-Z Time (1, 2) 3— 3— ns tHZ Output High-Z Time (1, 2) —12—15 ns tPU Chip Enable to Power Up Time (2) 0— 0— ns tPD Chip Disable to Power Down Time (2) —20—25 ns tSOP Semaphore Flag Update Pulse ( OE or SEM)10 — 12 — ns tSAA Semaphore Address Access Time — 20 — 25 ns 2939 tbl 12 2939 drw 05 893 Ω 30pF 347 Ω 5V DATAOUT BUSY INT 893 Ω 5pF 347 Ω 5V DATAOUT 2939 drw 04 Figure 1. AC Output Load Figure 2. Output Test Load (for tLZ, tHZ, tWZ, tOW) * Including scope and jig. NOTES: 1. Transition is measured ±200mV from Low or High-impedance voltage with Output Test Load (Figure 2). 2. This parameter is guaranteed by device characterization, but is not production tested. 3. To access RAM, CE = VIL and SEM = VIH. To access semaphore, CE = VIH and SEM = VIL. 4. "X" in part numbers indicates power rating (S or L). |
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