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IDT49C460AFFB Datasheet(PDF) 32 Page - Integrated Device Technology |
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IDT49C460AFFB Datasheet(HTML) 32 Page - Integrated Device Technology |
32 / 32 page ![]() 11.6 32 IDT49C460/A/B/C/D/E 32-BIT CMOS ERROR DETECTION AND CORRECTION UNIT MILITARY AND COMMERCIAL TEMPERATURE RANGES TEST LOAD CIRCUIT 2584 drw 14 DEFINITIONS: CL = Load capacitance: includes jig and probe capacitance RL = Termination resistance: should be equal to ZOUT of the Pulse Generator Figure 7. VOUT 50pF CL 500 Ω + 7.0V 500 Ω D.U.T. VCC VIN RT Pulse Generator ORDERING INFORMATION IDT 49C460 Device Type X Speed X Package X Process/ Temperature Range BLANK B G J FF Blank A B C D E Commercial (0 °C to + 70°C) Military (– 55 °C to + 125°C) Compliant to MIL-STD-883, Class B Pin Grid Array Plastic Leaded Chip Carrier Fine Pitch Flatpack Standard Speed High-Speed Very High-Speed Super-High-Speed Ultra-High Speed Fastest Speed 49C460 32-Bit E. D. C. 2584 drw 15 AC TEST CONDITIONS Input Pulse Levels GND to 3.0V Input Rise/Fall Times 1V/ns Input Timing Reference Levels 1.5V Output Reference Levels 1.5V Output Load See Figure 7 2584 tbl 69 Test Switch Disable Low Closed Enable Low All other Tests Open 2584 tbl 68 |
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