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AD1876 Datasheet(PDF) 3 Page - Analog Devices |
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AD1876 Datasheet(HTML) 3 Page - Analog Devices |
3 / 12 page TIMING SPECIFICATIONS 1 Parameter Symbol Min Typ Max Units Sampling Rate 2 fS = 1/tS 1 100 kSPS Sampling Period2 tS = l/fS 10 1000 µs Acquisition Time (Included in tS)tA 2 µs Calibration Time tCT 5000 tC CLK Period tC 480 ns CAL to BUSY Delay tCALB 0ns CLK to BUSY Delay tCB 50 120 175 ns CLK to DOUT Hold Time tCD 10 ns CLK HIGH tCH 160 ns CLK LOW tCL 50 ns DOUT CLK LOW tDCL 30 80 200 ns SAMPLE LOW to 1st CLK Delay tSC 50 ns CAL HIGH Time tCALH 4tC CLK to DOUT CLK tCDH 150 200 275 ns SAMPLE LOW tSL 50 ns NOTES 1See Figure 1 and Figure 2 and the Conversion Control and Autocalibration sections for detailed explanations of the above timing. 2Depends upon external clock frequency; includes acquisition time and conversion time. The minimum sampling rate/maximum sampling period is specified to account for droop of the internal sample/hold. Operation at slower rates than specified may degrade performance. DIGITAL SPECIFICATIONS Parameter Test Conditions Min Typ Max Units LOGIC INPUTS VIH High Level Input Voltage 2.4 V VIL Low Level Input Voltage –0.3 0.8 V IIH High Level Input Current VIH = VDD –10 +10 µA IIL Low Level Input Current VIL = 0 V –10 +10 µA CIN Input Capacitance 10 pF LOGIC OUTPUTS VOH High Level Output Voltage IOH = 0.1 mA VDD – 1 V V IOH = 0.5 mA 2.4 V VOL Low Level Output Voltage IOL = 1.6 mA 0.4 V Specifications subject to change without notice. Specifications shown in boldface are tested on all devices at final electrical test at worst case temperature. Results from those tests are used to calculate outgoing qual- ity levels. All min and max specifications are guaranteed, although only those shown in boldface are tested. AD1876 REV. A –3– ABSOLUTE MAXIMUM RATINGS* VCC to VEE . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +26.4 V VDD to DGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V VCC to AGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +18 V VEE to AGND . . . . . . . . . . . . . . . . . . . . . . . . –18 V to +0.3 V AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±0.3 V Digital Inputs to DGND . . . . . . . . . . . . . . . . . . . 0 V to 5.5 V Analog Inputs, VREF to AGND . . . . . . . . . . . (VCC + 0.3 V) to (VEE – 0.3 V) (TMIN to TMAX, VCC = +12 V 5%, VEE = –12 V 5%, VDD = +5 V 10%, VREF = 5.00 V) Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +300 °C, 10 sec Storage Temperature . . . . . . . . . . . . . . . . . . –60 °C to +100°C *Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. WARNING! ESD SENSITIVE DEVICE CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD1876 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. (TMIN to TMAX, VCC = +12 V 5%, VEE = –12 V 5%, VDD = +5 V 10%) OBSOLETE |
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