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HT82K68E Datasheet(PDF) 4 Page - Holtek Semiconductor Inc |
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HT82K68E Datasheet(HTML) 4 Page - Holtek Semiconductor Inc |
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4 / 40 page  Pin Name I/O ROM Code Option Description PC2~PC3 I/O Wake-up Pull-high or None Bidirectional 2-bit input/output port. Each bit can be configured as a wake-up input by ROM code option. Software* instructions determine the CMOS output or schmitt trigger input with or with- out pull-high resistor. PC4~PC7 I/O Pull-high or None Bidirectional 4-bit input/output port. Software* instructions de- termine the CMOS output or schmitt trigger input with or without pull-high resistor. PD0~PD7 I/O Pull-high or None Bidirectional 8-bit input/output port. Software* instructions de- termine the CMOS output or schmitt trigger input with or without pull-high resistor. PE0~PE1 I/O Pull-high or None Bidirectional input/output port. Software* instructions determine the CMOS output or schmitt trigger input with or without pull-high resistor. PE2~PE4 O ¾ This pin is an NMOS output structure. The pad can function as LED drivers for the keyboard. IOL=14mA, @VOL=3.2V VDD ¾¾ Positive power supply VSS ¾¾ Negative power supply, ground RESET I ¾ Chip reset input. Active low. Built-in power-on reset circuit to re- set the entire chip. Chip can also be externally reset via RESET pin OSC1 OSC2 I O Crystal or RC OSC1, OSC2 are connected to an RC network or a crystal for the internal system clock. In the case of RC operation, OSC2 is the output terminal for the 1/4 system clock; A 110kW resistor is con- nected to OSC1 to generate a 2MHZ frequency. Note: *: Software means the ROM code option can be configured by HT-IDE (Holtek Integrated De- velopment Environment). Absolute Maximum Ratings Supply Voltage .............................-0.3V to 5.5V Storage Temperature ................-50°Cto125°C Input Voltage ................VSS-0.3V to VDD+0.3V Operating Temperature .............-25°Cto70°C Note: These are stress ratings only. Stresses exceeding the range specified under ²Absolute Maxi- mum Ratings² may cause substantial damage to the device. Functional operation of this device at other conditions beyond those listed in the specification is not implied and prolonged expo- sure to extreme conditions may affect device reliability. HT82K68E 4 August 8, 2000 Preliminary |
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