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ADC12L063 Datasheet(PDF) 7 Page - Texas Instruments

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Part # ADC12L063
Description  12-Bit, 62 MSPS, 354 mW A/D Converter with Internal Sample-and-Hold
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

ADC12L063 Datasheet(HTML) 7 Page - Texas Instruments

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ADC12L063
www.ti.com
SNAS144E – JULY 2001 – REVISED MARCH 2013
Converter Electrical Characteristics
Unless otherwise specified, the following specifications apply for AGND = DGND = DR GND = 0V, VA = VD = VDR = +3.3V, PD
= 0V, VREF = +1.0V, fCLK = 62 MHz, tr = tf = 2 ns, CL = 20 pF/pin. Boldface limits apply for TA = TJ = TMIN to TMAX: all other
limits TA = TJ = 25°C
(1) (2) (3)
Units
Symbol
Parameter
Conditions
Typical (4)
Limits (4)
(Limits)
STATIC CONVERTER CHARACTERISTICS
Resolution with No Missing Codes
12
Bits
INL
Integral Non Linearity (5)
±1.0
±2.4
LSB(max)
DNL
Differential Non Linearity
±0.5
LSB(max)
GE
Gain Error
Positive Error
−0.8
%FS(max)
Negative Error
+0.1
±3
%FS(max)
Offset Error (VIN+ = VIN−)
+0.1
±0.9
%FS(max)
Under Range Output Code
0
0
Over Range Output Code
4095
4095
REFERENCE AND ANALOG INPUT CHARACTERISTICS
VCM
Common Mode Input Voltage
1.0
V
(CLK LOW)
8
pF
CIN
VIN Input Capacitance (each pin to GND)
VIN = 1.0 Vdc + 1 VP-P
(CLK HIGH)
7
pF
0.8
V(min)
VREF
Reference Voltage (6)
1.00
1.2
V(max)
Reference Input Resistance
100
M
Ω(min)
(1)
The inputs are protected as shown below. Input voltages above VA or below GND will not damage this device, provided current is limited
per Note 4 under the Absolute Maximum Ratings Table. However, errors in the A/D conversion can occur if the input goes above VA or
below GND by more than 100 mV. As an example, if VA is 3.3V, the full-scale input voltage must be ≤3.4V to ensure accurate
conversions. See Figure 2
(2)
To ensure accuracy, it is required that |VA–VD| ≤ 100 mV and separate bypass capacitors are used at each power supply pin.
(3)
With the test condition for VREF = +1.0V (2VP-P differential input), the 12-bit LSB is 488 µV.
(4)
Typical figures are at TA = TJ = 25°C, and represent most likely parametric norms. Test limits are specified to TI's AOQL (Average
Outgoing Quality Level).
(5)
Integral Non Linearity is defined as the deviation of the analog value, expressed in LSBs, from the straight line that passes through
positive and negative full-scale.
(6)
Optimum dynamic performance will be obtained by keeping the reference input in the 0.8V to 1.2V range. The LM4051CIM3-ADJ or the
LM4051CIM3-1.2 bandgap voltage reference is recommended for this application.
DC and Logic Electrical Characteristics
Unless otherwise specified, the following specifications apply for AGND = DGND = DR GND = 0V, VA = VD= VDR = +3.3V, PD
= 0V, VREF = +1.0V, fCLK = 62 MHz, tr = tf = 2 ns, CL = 20 pF/pin. Boldface limits apply for TA = TJ = TMIN to TMAX: all other
limits TA = TJ = 25°C
(1) (2) (3)
Units
Symbol
Parameter
Conditions
Typical (4)
Limits (4)
(Limits)
CLK, PD, OE DIGITAL INPUT CHARACTERISTICS
VIN(1)
Logical “1” Input Voltage
VD = 3.3V
2.0
V(min)
VIN(0)
Logical “0” Input Voltage
VD = 3.0V
0.8
V(max)
IIN(1)
Logical “1” Input Current
VIN
+, V
IN
= 3.3V
10
µA
IIN(0)
Logical “0” Input Current
VIN
+, V
IN
= 0V
−10
µA
CIN
Digital Input Capacitance
5
pF
D0–D11 DIGITAL OUTPUT CHARACTERISTICS
(1)
The inputs are protected as shown below. Input voltages above VA or below GND will not damage this device, provided current is limited
per Note 4 under the Absolute Maximum Ratings Table. However, errors in the A/D conversion can occur if the input goes above VA or
below GND by more than 100 mV. As an example, if VA is 3.3V, the full-scale input voltage must be ≤3.4V to ensure accurate
conversions. See Figure 2
(2)
To ensure accuracy, it is required that |VA–VD| ≤ 100 mV and separate bypass capacitors are used at each power supply pin.
(3)
With the test condition for VREF = +1.0V (2VP-P differential input), the 12-bit LSB is 488 µV.
(4)
Typical figures are at TA = TJ = 25°C, and represent most likely parametric norms. Test limits are specified to TI's AOQL (Average
Outgoing Quality Level).
Copyright © 2001–2013, Texas Instruments Incorporated
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