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ADS7871IDBR Datasheet(PDF) 2 Page - Texas Instruments

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Part # ADS7871IDBR
Description  PGA Gains: 1, 2, 4, 5, 8, 10, 16, 20 V/V
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

ADS7871IDBR Datasheet(HTML) 2 Page - Texas Instruments

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ADS7871
SLAS370C − APRIL 2002 − REVISED OCTOBER 2004
www.ti.com
2
ORDERING INFORMATION(1)
PRODUCT
PACKAGE-LEAD
PACKAGE
DESIGNATOR
SPECIFIED
TEMPERATURE
RANGE
PACKAGE
MARKING
ORDERING
NUMBER
TRANSPORT MEDIA,
QUANTITY
ADS7871
SSOP-28 Surface Mount
DB
−40
°C to +85°C
ADS7871
ADS7871IDB
Rails, 48
ADS7871
SSOP-28 Surface Mount
DB
−40
°C to +85°C
ADS7871
ADS7871IDBR
Tape and Reel, 1000
(1) For the most current package and ordering information, see the package option addendum located at the end of this data sheet.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate
precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to
damage because very small parametric changes could cause the device not to meet its published specifications.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted(1)
UNIT
Supply voltage, VDD
5.5 V
Input current
Momentary
100 mA
Analog inputs
Input current
Continuous
10 mA
Analog inputs
Input voltage
VDD + 0.5 V to GND − 0.5 V
Operating free-air temperature range, TA
−40
°C to 85°C
Storage temperature range, TSTG
−65
°C to 150°C
Junction temperature (TJ max)
150
°C
Lead temperature, (10 sec)
300
°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied.
Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.


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