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ADS7886 Datasheet(PDF) 3 Page - Texas Instruments |
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ADS7886 Datasheet(HTML) 3 Page - Texas Instruments |
3 / 24 page ADS7886 www.ti.com SLAS492A – SEPTEMBER 2005 – REVISED NOVEMBER 2009 ABSOLUTE MAXIMUM RATINGS (1) UNIT +IN to AGND –0.3 V to +VDD +0.3 V +VDD to AGND –0.3 V to 7 V Digital input voltage to GND –0.3 V to (7 V) Digital output to GND –0.3 V to (+VDD + 0.3 V) Operating temperature range –40°C to 125°C Storage temperature range –65°C to 150°C Junction temperature (TJ Max) 150°C Power dissipation, SOT23 and SC70 packages (TJ Max–TA)/θJA SOT23 295.2°C/W θJA Thermal impedance SC70 351.3°C/W Vapor phase (60 sec) 215°C Lead temperature, soldering Infrared (15 sec) 220°C (1) Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute maximum conditions for extended periods may affect device reliability. ELECTRICAL CHARACTERISTICS +VDD = 2.35 V to 5.25 V, TA = –40°C to 125°C, f(sample) = 1 MHz (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT ANALOG INPUT Full-scale input voltage span(1) 0 VDD V Absolute input voltage range +IN –0.2 VDD+0.2 V CI Input capacitance(2) 21 pF Ilkg Input leakage current TA = 125°C 40 nA SYSTEM PERFORMANCE Resolution 12 Bits ADS7886SB 12 No missing codes Bits ADS7886S 11 ADS7886SB –1.25 ±0.65 1.25 INL Integral nonlinearity LSB(3) ADS7886S 2 2 ADS7886SB –1 +0.4/-0.65 1 DNL Differential nonlinearity LSB ADS7886S -2 2 VDD = 2.35 V to 3.6 V –2.5 ±0.5 2.5 EO Offset error(4) LSB VDD = 4.75 V to 5.25 V -2 ±0.5 2 EG Gain error –1.75 ±0.5 1.75 LSB SAMPLING DYNAMICS Conversion time 20-MHz SCLK 760 800 ns Acquisition time 325 ns Maximum throughput rate 20-MHz SCLK 1 MHz Aperture delay 5 ns Step Response 160 ns Overvoltage recovery 160 ns DYNAMIC CHARACTERISTICS VDD = 2.35 V to 3.6 V, fI = 100 kHz 69 71.25 SNR Signal-to-noise ratio dB VDD = 4.75 V to 5.25 V, fI = 100 kHz 70 72.25 (1) Ideal input span; does not include gain or offset error. (2) See Figure 28 for details on the sampling circuit. (3) LSB means least significant bit. (4) Measured relative to an ideal full-scale input. Copyright © 2005–2009, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Link(s): ADS7886 |
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