LPV7215

SNOSAI6I – SEPTEMBER 2005 – REVISED APRIL 2013

www.ti.com

ABSOLUTE MAXIMUM RATINGS

(1) (2)

Human Body Model

2000V

Machine Model

200V

±2.5V

6V

Voltage at Input/Output pins

−0.3V

Storage Temperature Range

−65°C to +150°C

+150°C

Soldering Information

Infrared or Convection (20 sec)

235°C

Wave Soldering Lead Temp. (10 sec)

260°C

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but specific performance is not ensured. For ensured specifications and the test

conditions, see the Electrical Characteristics Tables.

(2)

If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office / Distributors for availability and

specifications.

(3)

Human Body Model, applicable std. MIL-STD-883, Method 3015.7. Machine Model, applicable std. JESD22-A115-A (ESD MM std. of

JEDEC)Field-Induced Charge-Device Model, applicable std. JESD22-C101-C (ESD FICDM std. of JEDEC).

(4)

OPERATING RATINGS

(1)

−40°C to 125°C

1.8V to 5.5V

Package Thermal Resistance (

5-Pin SC70

456°C/W

5-Pin SOT-23

234°C/W

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but specific performance is not ensured. For ensured specifications and the test

conditions, see the Electrical Characteristics Tables.

(2)

1.8V ELECTRICAL CHARACTERISTICS

(1)

apply at the temperature extremes.

Symbol

Parameter

Conditions

Units

Supply Current

580

750

1050

nA

790

980

1300

Input Offset Voltage

±0.3

±6

±8

mV

±0.4

±5

±7

Input Offset Average Drift

±1

μV/C

−40

fA

Input Offset Current

10

fA

(1)

Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device.

(2)

Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using

statistical quality control (SQC) method.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped

production material.

(4)

(5)

Positive current corresponds to current flowing into the device.

2

Submit Documentation Feedback

Copyright © 2005–2013, Texas Instruments Incorporated

Product Folder Links: LPV7215