LMV331-N, LMV339-N, LMV393-N

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SNOS018G – AUGUST 1999 – REVISED FEBRUARY 2013

Absolute Maximum Ratings

(1) (2)

Human Body Model

LMV331-N/393-N/339-N

800V

Machine Model

LMV331-N/339-N/393-N

120V

Differential Input Voltage

±Supply Voltage

Voltage on any pin

5.5V

Soldering Information

Infrared or Convection (20 sec)

235°C

Storage Temp. Range

−65°C to +150°C

150°C

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test

conditions, see the Electrical characteristics.

(2)

If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office / Distributors for

availability and specifications.

(3)

Human Body Model, applicable std. MIL-STD-883, Method 3015.7. Machine Model, applicable std. JESD22-A115-A (ESD MM std. of

JEDEC)Field-Induced Charge-Device Model, applicable std. JESD22-C101-C (ESD FICDM std. of JEDEC).

(4)

Operating Ratings

(1)

Supply Voltage

2.7V to 5.0V

LMV393-N. LMV339-N, LMV331-N

−40°C to +85°C

Thermal Resistance (

5-Pin SC70

478°C/W

5-Pin SOT23

265°C/W

8-Pin SOIC

190°C/W

8-Pin VSSOP

235°C/W

14-Pin SOIC

145°C/W

14-Pin TSSOP

155°C/W

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test

conditions, see the Electrical characteristics.

(2)

2.7V DC Electrical Characteristics

extremes.

Symbol

Parameter

Conditions

Min

Typ

Max

Units

(1)

(2)

(1)

Input Offset Voltage

1.7

7

mV

Input Offset Voltage Average Drift

5

µV/°C

Input Bias Current

10

250

nA

400

Input Offset Current

5

50

nA

150

(1)

All limits are guaranteed by testing or statistical analysis.

(2)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not guaranteed on

shipped production material.

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