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THS3120DGNR Datasheet(PDF) 3 Page - Texas Instruments |
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THS3120DGNR Datasheet(HTML) 3 Page - Texas Instruments |
3 / 36 page THS3120 THS3121 www.ti.com........................................................................................................................................ SLOS420E – SEPTEMBER 2003 – REVISED OCTOBER 2009 RECOMMENDED OPERATING CONDITIONS PARAMETER MIN NOM MAX UNIT Dual supply ±5 ±15 Supply voltage V Single supply 10 30 Commercial 0 +70 Operating free-air temperature, TA °C Industrial –40 +85 Operating junction temperature, continuous operating, TJ –40 +125 °C Normal storage temperature, TSTG –40 +85 °C ABSOLUTE MAXIMUM RATINGS (1) Over operating free-air temperature, unless otherwise noted. PARAMETER UNIT Supply voltage, VS– to VS+ 33 V Input voltage, VI ±VS Differential input voltage, VID ±4 V Output current, IO (2) 550 mA Continuous power dissipation See Dissipation Ratings Table Maximum junction temperature, TJ (3) +150°C Maximum junction temperature, continuous operation, long-term reliability, TJ (4) +125°C Commercial 0°C to +70°C Operating free-air temperature, TA Industrial –40°C to +85°C Storage temperature, TSTG –65°C to +125°C HBM 1000 ESD ratings: CDM 1500 MM 200 (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) The THS3120 and THS3121 may incorporate a PowerPAD on the underside of the chip. This acts as a heatsink and must be connected to a thermally dissipating plane for proper power dissipation. Failure to do so may result in exceeding the maximum junction temperature which could permanently damage the device. See TI Technical Brief SLMA002 for more information about using the PowerPAD thermally-enhanced package. (3) The absolute maximum temperature under any condition is limited by the constraints of the silicon process. (4) The maximum junction temperature for continuous operation is limited by the package constraints. Operation above this temperature may result in reduced reliability and/or lifetime of the device. Copyright © 2003–2009, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Link(s): THS3120 THS3121 |
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