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FQB11N40CTM Datasheet(PDF) 5 Page - Fairchild Semiconductor |
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FQB11N40CTM Datasheet(HTML) 5 Page - Fairchild Semiconductor |
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5 / 8 page  Figure 12. Gate Charge Test Circuit & Waveform Figure 13. Resistive Switching Test Circuit & Waveforms Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms VGS VDS 10% 90% t d(on) t r t on t off t d(off) tf VDD 10V VDS RL DUT RG VGS VGS VDS 10% 90% t d(on) t r t on t off t d(off) tf VDD 10V VDS RL DUT RG VGS VGS Charge VGS 10V Qg Qgs Qgd 3mA VGS DUT VDS 300nF 50KΩ 200nF 12V Same Type as DUT Charge VGS 10V Qg Qgs Qgd 3mA VGS DUT VDS 300nF 50KΩ 200nF 12V Same Type as DUT EAS =L IAS2 ---- 2 1 -------------------- BVDSS -VDD BVDSS VDD VDS BVDSS t p VDD IAS VDS (t) ID (t) Time 10V DUT RG L I D t p EAS =L IAS2 ---- 2 1 EAS =L IAS2 ---- 2 1 ---- 2 1 -------------------- BVDSS -VDD BVDSS VDD VDS BVDSS t p VDD IAS VDS (t) ID (t) Time 10V DUT RG LL I D I D t p VGS VGS IG = const. ©2004 Fairchild Semiconductor Corporation FQB11N40C Rev. C0 www.fairchildsemi.com 5 |
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