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AP-CF032GL9FS-NDRM Datasheet(PDF) 10 Page - List of Unclassifed Manufacturers

Part # AP-CF032GL9FS-NDRM
Description  Specifications for Industrial CompactFlash Card
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AP-CF032GL9FS-NDRM Datasheet(HTML) 10 Page - List of Unclassifed Manufacturers

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Compact Flash 5 series
AP-CFxxxxL9XS-XXXXXX
9
© 2012 Apacer Technology Inc.
Rev. 1.2
6. Flash Management
6.1 Intelligent Endurance Design
6.1.1 Advanced wear-leveling algorithms
Flash memory devices differ from Hard Disk Drives (HDDs) in terms of how blocks are utilized. For HDDs,
when a change is made to stored data, like erase or update, the controller mechanism on HDDs will
perform overwrites on blocks. On the other hand, NAND flash storage adopts flash as their primary media.
Unlike HDDs, flash blocks cannot be overwritten and each P/E cycle wears down the lifespan of blocks
gradually. Repeatedly program/erase cycles performed on the same memory cells will eventually cause
some blocks to age faster than others. This would bring flash storages to their end of service term earlier.
Wear leveling is an important mechanism that level out the wearing of blocks so that the wearing-down of
blocks can be almost evenly distributed. This will increase the lifespan of SSDs. Commonly used wear
leveling types are Static and Dynamic.
6.1.2 S.M.A.R.T. Technology
S.M.A.R.T. is an acronym for Self-Monitoring, Analysis and Reporting Technology, an open standard
allowing disk drives to automatically monitor their own health and report potential problems. It protects the
user from unscheduled downtime by monitoring and storing critical drive performance and calibration
parameters. Ideally, this should allow taking proactive actions to prevent impending drive failure. Apacer
SMART feature adopts the standard SMART command B0h to read data from the drive. When the Apacer
SMART Utility running on the host, it analyzes and reports the disk status to the host before the device is
in critical condition.
6.1.3 Built-in Hardware ECC
The ECC bit encoding takes places when host/OS writes data to the SSD. This step is simpler and quick.
On the other hand, the ECC bit decoding is processed when host/OS reads data from the SSD. In this
step, the ECC codes will be in progress for detecting, comparing and detecting potential error. Thus, the
power of the ECC lies mostly in the read data side.
This ATA CompactFlash card employs BCH Error Correction Code (ECC) algorithms. This on-chip
hardware BCH-ECC engines is 13/24 bit programmed that can correct up to 24-bit errors per 1,024 byte
data. This built-in hardware ECC performs parity generation and error detection/correction for data
integrity.
6.2 Intelligent Power Failure Recovery
Power Failure Management ensures data transmission when experiencing unstable power supply. When
power disruption takes places, NAND Flash will have to cache multiple write-to-flash cycles to securely
store data. This urgent operation requires about several milliseconds to get it done. When the supplied
voltage is below a certain percentage of the required, the flash controller will be signaled by a detector IC
component with low power detection signal and then the firmware will communicate the controller to flush
all the data into the cache of Flash storage area. This can prevent incomplete data transmission. The
crucial part lies in the strength of the capacitor of the SSD. The capacitor must be able to hold up some
milliseconds of remaining time before the power is totally out, for the urgent write-back-into-flash
operations to complete.


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