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C1210C226M3RACTU Datasheet(PDF) 3 Page - Kemet Corporation |
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C1210C226M3RACTU Datasheet(HTML) 3 Page - Kemet Corporation |
3 / 24 page © KEMET Electronics Corporation • P.O. Box 5928 • Greenville, SC 29606 (864) 963-6300 • www.kemet.com C1002_X7R_SMD • 6/6/2014 3 Surface Mount Multilayer Ceramic Chip Capacitors (SMD MLCCs) – X7R Dielectric, 6.3 – 250 VDC (Commercial Grade) Electrical Parameters/Characteristics Item Parameters/Characteristics Operating Temperature Range -55°C to +125°C CapacitanceChangewithReferenceto+25°Cand0VDCApplied(TCC) ±15% Aging Rate (Maximum % Capacitance Loss/Decade Hour) 3.0% DielectricWithstandingVoltage(DWV) 250% of rated voltage (5±1secondandcharge/dischargenotexceeding50mA) Dissipation Factor (DF) Maximum Limit @ 25ºC See Dissipation Factor (DF) Limits Table Insulation Resistance (IR) Limit @ 25°C See Insulation Resistance Limit Table (Rated voltage applied for 120 ±5 seconds @ 25°C) Regarding aging rate: Capacitance measurements (including tolerance) are indexed to a referee time of 48 or 1,000 hours. Please refer to a part number specific datasheet for referee time details. To obtain IR limit, divide MΩ-µF value by the capacitance and compare to GΩ limit. Select the lower of the two limits. Capacitance and dissipation factor (DF) measured under the following conditions: 1 kHz ±50 Hz and 1.0 ±0.2 Vrms if capacitance ≤ 10 µF 120 Hz ±10 Hz and 0.5 ±0.1 Vrms if capacitance > 10 µF Note: When measuring capacitance it is important to ensure the set voltage level is held constant. The HP4284 and Agilent E4980 have a feature known as Automatic Level Control (ALC). The ALC feature should be switched to "ON." Insulation Resistance Limit Table (X7R Dielectric) EIA Case Size 1,000 Megohm Microfarads or 100 GΩ 500 Megohm Microfarads or 10 GΩ 0201 N/A ALL 0402 < 0.012 µF ≥0.012µF 0603 < 0.047 µF ≥0.047µF 0805 < 0.15 µF ≥0.15µF 1206 < 0.47 µF ≥0.47µF 1210 < 0.39 µF ≥0.39µF 1808 ALL N/A 1812 < 2.2 µF ≥2.2µF 1825 ALL N/A 2220 < 10 µF ≥10µF 2225 ALL N/A |
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