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DCR806SG26 Datasheet(PDF) 6 Page - Dynex Semiconductor |
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DCR806SG26 Datasheet(HTML) 6 Page - Dynex Semiconductor |
6 / 8 page www.dynexsemi.com 6/8 DCR806SG Fig.6 Maximum (limit) transient thermal impedance - junction to case Fig.7 Surge (non-repetitive) on-state current vs time (with 50% V RRM at T case 125˚C) 20 15 10 5 0 110 1 2 3 4 5 50 ms Cycles at 50Hz Duration 250 300 I2t I2t = Î2 x t 2 350 25 400 10 20 30 0.1 0.01 0.001 0.001 0.01 0.1 1.0 10 Time - (s) Anode side cooled Double side cooled Conduction Effective thermal resistance Junction to case ˚C/W Double side 0.032 0.034 0.044 0.057 Anode side 0.064 0.066 0.076 0.089 d.c. Halfwave 3 phase 120˚ 6 phase 60˚ Fig.4 Stored charge Fig.5 Gate characteristics 0.1 1.0 10 100 Rate of decay of on-state current dI/dt - (A/µs) 10000 1000 100 Conditions: QS is total integral stored charge Tj = 125˚C IT = 1250A IT = 500A Max. value IT = 1250A IT = 500A Min. value I RR Q S I T dI/dt 10 1 0.1 0.01 0.001 Gate trigger current, IGT - (A) 100 10 1 0.1 Region of certain triggering Upper limit 99% Low er limit 99% VGD IFGM Table gives pulse power PGM in Watts Pulse width µs 100 200 500 1ms 10ms Frequency Hz 50 150 150 150 150 20 100 150 150 150 100 - 400 150 125 100 25 - |
Similar Part No. - DCR806SG26 |
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Similar Description - DCR806SG26 |
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