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DS1035Z-30 Datasheet(PDF) 3 Page - Dallas Semiconductor |
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DS1035Z-30 Datasheet(HTML) 3 Page - Dallas Semiconductor |
3 / 6 page DS1035 3 of 6 TEST SETUP DESCRIPTION Figure 2 illustrates the hardware configuration used for measuring the timing parameters of the DS1035. The input waveform is produced by a precision pulse generator under software control. Time delays are measured by a time interval counter (20 ps resolution ) connected to the output. The DS1035 output taps are selected and connected to the interval counter by a VHF switch control unit. All measurements are fully automated with each instrument controlled by the computer over an IEEE 488 bus. DS1035 TEST CIRCUIT Figure 2 |
Similar Part No. - DS1035Z-30 |
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Similar Description - DS1035Z-30 |
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