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DS1010 Datasheet(PDF) 6 Page - Dallas Semiconductor |
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DS1010 Datasheet(HTML) 6 Page - Dallas Semiconductor |
6 / 6 page ![]() DS1010 6 of 6 TEST SETUP DESCRIPTION Figure 3 illustrates the hardware configuration used for measuring the timing parameters on the DS1010. The input waveform is produced by a precision pulse generator under software control. Time delays are measured by a time interval counter (20 ps resolution) connected between the input and each tap. Each tap is selected and connected to the counter by a VHF switch control unit. All measurements are fully automated, with each instrument controlled by a central computer over an IEEE 488 bus. TEST CONDITIONS INPUT: Ambient Temperature: 25°C ± 3°C Supply Voltage (VCC): 5.0V ± 0.1V Input Pulse: High = 3.0V ± 0.1V Low = 0.0V ± 0.1V Source Impedance: 50 ohm max. Rise and Fall Time: 3.0 ns max. Pulse Width: 500 ns (1 µs for -500) Period: 1 µs ( 2 µs for -500) OUTPUT: Each output is loaded with the equivalent of one 74FO4 input gate. Delay is measured at the 1.5V level on the rising and falling edge. NOTE: Above conditions are for test only and do not restrict the operation of the device under other data sheet conditions. |