LMV341-N, LMV342-N, LMV344-N

SNOS990G – APRIL 2002 – REVISED MARCH 2013

www.ti.com

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

Absolute Maximum Ratings

(1) (2)

Machine Model

200V

Human Body Model

2000V

Differential Input Voltage

± Supply Voltage

6.0V

Storage Temperature Range

−65°C to 150°C

150°C

Mounting Temperature

Infrared or Convection Reflow (20 sec.)

235°C

Wave Soldering Lead Temperature (10 sec.)

260°C

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but specific performance is not ensured. For ensured specifications and the test

conditions, see the Electrical Characteristics.

(2)

If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and

specifications.

(3)

Human Body Model, applicable std. MIL-STD-883, Method 3015.7. Machine Model, applicable std. JESD22-A115-A (ESD MM std. of

JEDEC)Field-Induced Charge-Device Model, applicable std. JESD22-C101-C (ESD FICDM std. of JEDEC).

(4)

(5)

(6)

Operating Ratings

(1)

Supply Voltage

2.7V to 5.5V

Temperature Range

−40°C to 125°C

Thermal Resistance (

6-Pin SC70

414°C/W

8-Pin SOIC

190°C/W

8-Pin VSSOP

235°C/W

14-Pin TSSOP

155°C/W

14-Pin SOIC

145°C/W

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but specific performance is not ensured. For ensured specifications and the test

conditions, see the Electrical Characteristics.

2

Submit Documentation Feedback

Copyright © 2002–2013, Texas Instruments Incorporated

Product Folder Links: LMV341-N LMV342-N LMV344-N