Electronic Components Datasheet Search |
|
OPA835IDBVT Datasheet(PDF) 6 Page - National Semiconductor (TI) |
|
|
OPA835IDBVT Datasheet(HTML) 6 Page - National Semiconductor (TI) |
6 / 53 page OPA835 OPA2835 SLOS713E – JANUARY 2011 – REVISED JULY 2013 www.ti.com SPECIFICATIONS: VS = 5 V Test conditions unless otherwise noted: VS+ = +5 V, VS– = 0 V, VOUT = 2 VPP, RF = 0 Ω, RL = 2 kΩ, G = 1 V/V, Input and Output Referenced to mid-supply. TA = 25°C. Unless otherwise noted. TEST PARAMETER CONDITIONS MIN TYP MAX UNITS LEVEL(1) AC PERFORMANCE VOUT = 100 mVPP, G = 1 56 VOUT = 100 mVPP, G = 2 22.5 Small-signal bandwidth MHz C VOUT = 100 mVPP, G = 5 7.4 VOUT = 100 mVPP, G = 10 3.1 Gain-bandwidth product VOUT = 100 mVPP, G = 10 31 MHz C Large-signal bandwidth VOUT = 2 VPP, G = 1 31 MHz C Bandwidth for 0.1dB flatness VOUT = 2 VPP, G=2 14.5 MHz C Slew rate, Rise/Fall 160/260 V/µs C Rise/Fall time 10/7 ns C Settling time to 1%, Rise/Fall 45/45 ns C VOUT = 2 V Step, G = 2 Settling time to 0.1%, Rise/Fall 50/55 ns C Settling time to 0.01%, Rise/Fall 82/85 ns C Overshoot/Undershoot 2.5/1.5 % C f = 10 kHz –135 C f = 100 kHz –105 dBc C 2nd Order Harmonic Distortion f = 1 MHz -70 C f = 10 kHz –139 C f = 100 kHz –122 dBc C 3rd Order Harmonic Distortion f = 1 MHz -73 C –70 dBc C 2nd Order Intermodulation Distortion f = 1 MHz, 200 kHz Tone Spacing, VOUT Envelope = 2 VPP –83 dBc C 3rd Order Intermodulation Distortion 0.00015 % Signal to Noise Ratio, SNR f = 1kHz, VOUT = 1 VRMS, 22kHz bandwidth C -116.4 dBc 0.00003 % C Total Harmonic Distortion, THD f = 1kHz, VOUT = 1 VRMS -130 dBc C Input voltage noise f = 100 KHz 9.3 nV/ √Hz C Voltage Noise 1/f corner frequency 147 Hz C Input current noise f = 1 MHz 0.45 pA/ √Hz C Current Noise 1/f corner frequency 14.7 Hz C Overdrive recovery time, Over/Under Overdrive = 0.5 V 195/135 ns C Closed-loop output impedance f = 100 kHz 0.028 Ω C Channel to channel crosstalk f = 10 kHz -120 dB C (OPA2835) (1) Test levels (all values set by characterization and simulation): (A) 100% tested at 25°C; over temperature limits by characterization and simulation. (B) Not tested in production; limits set by characterization and simulation. (C) Typical value only for information. 6 Submit Documentation Feedback Copyright © 2011–2013, Texas Instruments Incorporated Product Folder Links: OPA835 OPA2835 |
Similar Part No. - OPA835IDBVT |
|
Similar Description - OPA835IDBVT |
|
|
Link URL |
Privacy Policy |
ALLDATASHEET.COM |
Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Datasheet Upload | Contact us | Privacy Policy | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |