CAT28F020

5

Doc. No. 25037-00 2/98 F-1

SUPPLY CHARACTERISTICS

Limits

Symbol

Parameter

Min

Max.

Unit

4.5

5.5

V

0

6.5

V

11.4

12.6

V

Testing Load Circuit (example)

A.C. CHARACTERISTICS, Read Operation

JEDEC

Standard

Symbol

Symbol

Parameter

Min.

Max.

Min.

Max.

Unit

Read Cycle Time

120

ns

CE Access Time

120

ns

Address Access Time

120

ns

OE Access Time

50

ns

Output Hold from Address

OE/CE Change

0

ns

OE to Output in Low-Z

0

ns

CE to Output in Low-Z

0

ns

OE High to Output High-Z

30

ns

CE High to Output High-Z

40

40

ns

-

Write Recovery Time Before Read

6

Max.

Min.

70

70

28

70

0

0

0

20

30

6

1.3V

DEVICE

UNDER

TEST

1N914

3.3K

CL = 100 pF

OUT

CL INCLUDES JIG CAPACITANCE

1.3V

DEVICE

UNDER

TEST

1N914

3.3K

CL = 30 pF

OUT

CL INCLUDES JIG CAPACITANCE

INPUT PULSE LEVELS

REFERENCE POINTS

2.0 V

0.8 V

2.4 V

0.45 V

INPUT PULSE LEVELS

REFERENCE POINTS

1.5 V

3.0 V

0.0 V

Testing Load Circuit (example)

Figure 2. Highspeed A.C. Testing Input/Output

Note:

(1)

This parameter is tested initially and after a design or process change that affects the parameter.

(2)

Output floating (High-Z) is defined as the state where the external data line is no longer driven by the output buffer.

(3)

Input Rise and Fall Times (10% to 90%) < 10 ns.

(4)

Input Pulse Levels = 0.45V and 2.4V. For High Speed Input Pulse Levels 0.0V and 3.0V.

(5)

Input and Output Timing Reference = 0.8V and 2.0V. For High Speed Input and Output Timing Reference = 1.5V.

(6)

Low-Z is defined as the state where the external data may be driven by the output buffer but may not be valid.

(7)

For load and reference points, see Fig. 1

(8)

For load and reference points, see Fig. 2

90

90

35

90

0

0

0

30

6