STANDARD

MICROCIRCUIT DRAWING

SIZE

A

5962-00517

DLA LAND AND MARITIME

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

G

SHEET

3

DSCC FORM 2234

APR 97

1.3 Absolute maximum ratings. 1/

Supply voltage ............................................................................................. ±18 V

Power dissipation ........................................................................................ 500 mW

Differential input voltage .............................................................................. ±0.6 V

Input voltage ................................................................................................ ±18 V

Output short-circuit duration ........................................................................ Indefinite

Storage temperature range ......................................................................... -65°C to +150°C

Lead temperature (soldering, 60 seconds) .................................................. +300°C

Thermal resistance, junction-to-case (

Thermal resistance, junction-to-ambient (

Case C ..................................................................................................... 108°C/W

Case D ..................................................................................................... 160°C/W

1.4 Recommended operating conditions.

1.5 Radiation features:

Maximum total dose available (dose rate = 50 – 300 rads(Si)/s):

Device type 01 ......................................................................................... 100 krads(Si) 2/

Maximum total dose available (dose rate

≤ 10 mrads(Si)/s):

Device type 02 ......................................................................................... 50 krads(Si) 3/

2. APPLICABLE DOCUMENTS

2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part

of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the

solicitation or contract.

DEPARTMENT OF DEFENSE SPECIFICATION

MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.

DEPARTMENT OF DEFENSE STANDARDS

MIL-STD-883

-

Test Method Standard Microcircuits.

MIL-STD-1835 -

Interface Standard Electronic Component Case Outlines.

DEPARTMENT OF DEFENSE HANDBOOKS

MIL-HDBK-103 -

List of Standard Microcircuit Drawings.

MIL-HDBK-780 -

Standard Microcircuit Drawings.

(Copies of these documents are available online at http://quicksearch.dla.mil or from the Standardization Document Order

Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

_____

1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the

maximum levels may degrade performance and affect reliability.

2/ Device type 01 may be dose rate sensitive in space environment and may demonstrate enhanced low dose rate effects.

Radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883,

method 1019, condition A.

3/ For device type 02, radiation end point limits for the noted parameters are guaranteed for the conditions specified in

MIL-STD-883, method 1019, condition D.