Electronic Components Datasheet Search
  English  ▼

Delete All
ON OFF
ALLDATASHEET.COM

X  

Preview PDF Download HTML

ADS823 Datasheet(PDF) 2 Page - Texas Instruments

Click here to check the latest version.
Part No. ADS823
Description  10-Bit, 60MHz Sampling ANALOG-TO-DIGITAL CONVERTER
Download  16 Pages
Scroll/Zoom Zoom In 100% Zoom Out
Maker  TI [Texas Instruments]
Homepage  http://www.ti.com
Logo 

ADS823 Datasheet(HTML) 2 Page - Texas Instruments

 
Zoom Inzoom in Zoom Outzoom out
 2 / 16 page
background image
ADS823, ADS826
SBAS070B
2
www.ti.com
+VS ....................................................................................................... +6V
Analog Input ............................................................. –0.3V to (+VS + 0.3V)
Logic Input ............................................................... –0.3V to (+VS + 0.3V)
Case Temperature ......................................................................... +100
°C
Junction Temperature .................................................................... +150
°C
Storage Temperature ..................................................................... +150
°C
ABSOLUTE MAXIMUM RATINGS(1)
SPECIFIED
PACKAGE
TEMPERATURE
PACKAGE
ORDERING
TRANSPORT
PRODUCT
PACKAGE-LEAD
DESIGNATOR(1)
RANGE
MARKING
NUMBER(1)
MEDIA, QUANTITY
ADS823E
SSOP-28
DB
–40
°C to +85°C
ADS823E
ADS823E
Rails
"
"
"
"
"
ADS823E/1K
Tape and Reel, 1000
ADS826E
SSOP-28
DB
–40
°C to +85°C
ADS826E
ADS826E
Rails
"
"
"
"
"
ADS826E/1K
Tape and Reel, 1000
NOTE: (1) Fot the most current specifications and package information, refer to our web site at www.ti.com. (2) Models with a slash (/) are available only in Tape
and Reel in the quantities indicated (e.g., /1K indicates 1000 devices per reel). Ordering 1000 pieces of ADS823E/1K” will get a single 1000-piece Tape and Reel.
PACKAGE/ORDERING INFORMATION
ELECTROSTATIC
DISCHARGE SENSITIVITY
This integrated circuit can be damaged by ESD. Texas Instru-
ments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling
and installation procedures can cause damage.
ESD damage can range from subtle performance degradation
to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric
changes could cause the device not to meet its published
specifications.
ELECTRICAL CHARACTERISTICS
At TA = full specified temperature range, VS = +5V single-ended input range = 1.5V to 3.5V, sampling rate = 60MHz, external reference, unless otherwise noted.
ADS823E
ADS826E(1)
MIN
TYP
MAX
MIN
TYP
MAX
UNITS
RESOLUTION
10 Tested
10 Tested
Bits
SPECIFIED TEMPERATURE RANGE
Ambient Air
–40 to +85
–40 to +85
°C
ANALOG INPUT
Standard Single-Ended Input Range
2Vp-p
1.5
3.5
✻✻
V
Optional Single-Ended Input Range
1Vp-p
2
3
✻✻
V
Common-Mode Voltage
2.5
V
Optional Differential Input Range
2Vp-p
2
3
✻✻
V
Analog Input Bias Current
1
µA
Input Impedance
1.25 || 5
M
Ω || pF
Track-Mode Input Bandwidth
–3dBFS Input
300
MHz
CONVERSION CHARACTERISTICS
Sample Rate
10k
60M
✻✻
Samples/s
Data Latency
5
Clk Cyc
DYNAMIC CHARACTERISTICS
Differential Linearity Error (largest code error)
f = 1MHz
±0.25
±1.0
✻✻
LSB
f = 10MHz
±0.25
LSB
No Missing Codes
Tested
Tested
Integral Nonlinearity Error, f = 1MHz
±0.5
±2.0
✻✻
LSBs
Spurious-Free Dynamic Range(2)
f = 1MHz
74
73
dBFS(3)
f = 10MHz
67
74
65
73
dBFS
2-Tone Intermodulation Distortion(4)
f = 9.5MHz and 9.9MHz (–7dB each tone)
64
dBc
Signal-to-Noise Ratio (SNR)
Referred to Full-Scale Sinewave
f = 1MHz
60
59
dB
f = 10MHz
57
60
56
59
dB
Signal-to-(Noise + Distortion) (SINAD)
Referred to Full-Scale Sinewave
f = 1MHz
59
58
dB
f = 10MHz
56
59
55
58
dB
Effective Number of Bits(5), f = 1MHz
9.5
Bits
Output Noise
Input Grounded
0.2
LSBs rms
Aperture Delay Time
3
ns
Aperture Jitter
1.2
ps rms
Over Voltage Recovery Time(5)
2
ns
Full-Scale Step Acquisition Time
5
ns
NOTE:(1)Stressesbeyondthoselistedunder"absolutemaximumratings"maycause
permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated under
"recommended operating conditions" is not implied. Exposure to absolute-maximum-
rated conditions of extended periods may affect device reliability.
PRODUCT
EVALUATION MODULE
ADS823E
DEM-ADS823E
EVALUATION MODULE ORDERING INFORMATION


Html Pages

1  2  3  4  5  6  7  8  9  10  11  12  13  14  15  16 


Datasheet Download




Link URL




Privacy Policy
ALLDATASHEET.COM
Does ALLDATASHEET help your business so far?  [ DONATE ]  

About Alldatasheet   |   Advertisement   |   Datasheet Upload   |   Contact us   |   Privacy Policy   |   Alldatasheet API   |   Link Exchange   |   Manufacturer List
All Rights Reserved© Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn