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ADS1120IRVAR Datasheet(PDF) 2 Page - Texas Instruments

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Part # ADS1120IRVAR
Description  Low-Power, Low-Noise, 16-Bit, Analog-to-Digital Converter for Small-Signal Sensors
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

ADS1120IRVAR Datasheet(HTML) 2 Page - Texas Instruments

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ADS1120
SBAS535A – AUGUST 2013 – REVISED JANUARY 2014
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
Ordering Information
For the most current package and ordering information, see the Package Option Addendum at the end of this
document, or visit the device product folder at www.ti.com.
Product Family
MAXIMUM SAMPLE
PACKAGE
DEVICE
RESOLUTION (Bits)
MAXIMUM GAIN
RATE (SPS)
DESIGNATOR
QFN-16
ADS1120
16
128
2000
TSSOP-16
QFN-16
ADS1220
24
128
2000
TSSOP-16
Absolute Maximum Ratings
(1)
VALUE
UNIT
MIN
MAX
AVDD to AVSS
–0.3
+7
V
DVDD to DGND
–0.3
+7
V
AVSS to DGND
–2.8
+0.3
V
Analog input voltage
AIN0/REFP1, AIN1, AIN2, AIN3/REFN1, REFP0, REFN0
AVSS – 0.3
AVDD + 0.3
V
Digital input voltage
CS, SCLK, DIN, DOUT/DRDY, DRDY, CLK
DGND – 0.3
DVDD + 0.3
V
Analog input current
Continuous
–10
+10
mA
Maximum junction, TJMax
+150
°C
Temperature
Storage, TSTG
–60
+150
°C
Human body model (HBM)
–2000
+2000
V
JEDEC standard 22, test method A114-C.01, all pins
Electrostatic discharge (ESD)
ratings
Charged device model (CDM)
–500
+500
V
JEDEC standard 22, test method C101, all pins
(1)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and do not imply functional operation of the device at these or any other conditions beyond those indicated. Exposure to absolute-
maximum-rated conditions for extended periods may affect device reliability.
Thermal Information
ADS1120
THERMAL METRIC(1)
QFN (RVA)
TSSOP (PW)
UNITS
16 PINS
16 PINS
θJA
Junction-to-ambient thermal resistance
43.4
99.5
θJCtop
Junction-to-case (top) thermal resistance
47.3
35.2
θJB
Junction-to-board thermal resistance
18.4
44.3
°C/W
ψJT
Junction-to-top characterization parameter
0.6
2.4
ψJB
Junction-to-board characterization parameter
18.4
43.8
θJCbot
Junction-to-case (bottom) thermal resistance
2.0
n/a
(1)
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
2
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Copyright © 2013–2014, Texas Instruments Incorporated
Product Folder Links :ADS1120


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