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PCF8583T Datasheet(PDF) 20 Page - NXP Semiconductors |
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PCF8583T Datasheet(HTML) 20 Page - NXP Semiconductors |
20 / 37 page PCF8583 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 06 — 6 October 2010 20 of 37 NXP Semiconductors PCF8583 Clock and calendar with 240 x 8-bit RAM 10. Characteristics 10.1 Static characteristics [1] Typical values measured at Tamb = 25 °C. [2] When the device is powered on, VDD must exceed 1.5 V until the stable operation of the oscillator is established. [3] Event counter mode: supply current dependant upon input frequency. [4] See Figure 21. [5] The I2C-bus logic is disabled if VDD < Ven. [6] When the voltages are above or below the supply voltages VDD or VSS, an input current will flow; this current must not exceed ±0.5 mA. [7] Tested on a sample basis. Table 7. Static characteristics VDD = 2.5 V to 6.0 V; VSS = 0 V; Tamb = −40 °C to +85 °C unless otherwise specified. Symbol Parameter Conditions Min Typ[1] Max Unit VDD supply voltage operating mode I2C-bus active 2.5 - 6.0 V I2C-bus inactive 1.0 - 6.0 V quartz oscillator Tamb = 0 °C to +70 °C [2] 1.0 - 6.0 V IDD supply current operating mode fSCL = 100 kHz clock mode [3] - - 200 μA clock mode; fSCL = 0 Hz VDD = 5.0 V [4] -10 50 μA VDD = 1.0 V [4] -2 10 μA data retention; fOSCI = 0 Hz; VDD = 1.0 V Tamb = −40 °C to +85 °C --5 μA Tamb = −25 °C to +70 °C --2 μA Ven enable voltage I2C-bus enable level [5] 1.5 1.9 2.3 V Pin SDA VIL LOW-level input voltage [6] −0.8 - 0.3VDD V VIH HIGH-level input voltage [6] 0.7VDD -VDD + 0.8 V IOL LOW-level output current 3.0 - - mA ILI input leakage current −1- +1 μA CI input capacitance [7] --7 pF Pins A0 and OSCI ILI input leakage current VI = VDD or VSS −250 - +250 nA Pin INT IOL LOW-level output current VOL = 0.4 V 3 - - mA ILI input leakage current VI = VDD or VSS −1- +1 μA Pin SCL ILI input leakage current VI = VDD or VSS −1- +1 μA CI input capacitance [7] --7 pF |
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