74AUP1G32

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Product data sheet

Rev. 7 — 8 July 2013

11 of 21

NXP Semiconductors

74AUP1G32

Low-power 2-input OR-gate

[1]

Test data is given in Table 11.

Definitions for test circuit:

Fig 9.

Test circuit for measuring switching times

001aac521

DUT

RT

VI

VO

RL

5 k

Ω

CL

G

Table 11.

Test data

Supply voltage

Load

0.8 V to 3.6 V

5 pF, 10 pF, 15 pF and 30 pF

5 k

 or 1 M

open

GND

2

 V

CC