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SAA7154E Datasheet(PDF) 75 Page - NXP Semiconductors |
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SAA7154E Datasheet(HTML) 75 Page - NXP Semiconductors |
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75 / 90 page  SAA7154E_SAA7154H_2 © NXP B.V. 2007. All rights reserved. Product data sheet Rev. 02 — 6 December 2007 75 of 90 NXP Semiconductors SAA7154E; SAA7154H Multistandard video decoder with comb filter 11.4 Digital OSD application Figure 24 shows an example of an OSD application with the external OSD controller chip MTV048. 12. Test information 12.1 Boundary scan test The SAA7154E; SAA7154H has built-in logic and 5 dedicated pins to support boundary scan testing which allows board testing without special hardware. The SAA7154E; SAA7154H follows the IEEE Std. 1149.1 - Standard Test Access Port and Boundary-Scan Architecture set by the Joint Test Action Group (JTAG). The 5 special pins are Test Mode Select (TMS), Test Clock (TCK), Test Reset (TRST_N), Test Data Input (TDI) and Test Data Output (TDO). The Boundary Scan Test (BST) functions BYPASS, EXTEST, SAMPLE, CLAMP and IDCODE are all supported (see Table 45). Details about the JTAG BST-TEST can be found in specification IEEE Std. 1149.1. A file containing the detailed Boundary Scan Description Language (BSDL) description of the SAA7154E; SAA7154H is available on request. Fig 24. Application of SAA7154E; SAA7154H and an OSD controller chip (e.g. Myson MTV048) 001aab964 IPD[7:0] SAA7154 MTV048 (or another OSD controller) IXD[7:0] HPD[7:0] IGPH IGPV ICLK OSD_FSW OSD1 OSD2 OSD3 SDA SCL HFLB VFLB XIN I-port RGB out FBKG BOUT ROUT GOUT SDA SCL I2C-bus Table 45. BST instructions supported by the SAA7154E; SAA7154H Instruction Description BYPASS This mandatory instruction provides a minimum length serial path (1-bit) between TDI and TDO when no test operation of the component is required. EXTEST This mandatory instruction allows testing of off-chip circuitry and board level interconnections. |
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