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LP62S4096EU-55LLT Datasheet(PDF) 9 Page - AMIC Technology |
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LP62S4096EU-55LLT Datasheet(HTML) 9 Page - AMIC Technology |
9 / 14 page LP62S4096E-T Series (January, 2002, Version 2.0) 9 AMIC Technology, Inc. Write Cycle 2 (6) (Chip Enable Controlled) tWC Address tAW tWR3 (4) tCW1 , tCW2 tAS1 DIN tDW tWHZ7 DOUT tDH tWP2 WE CE2 CE1 Notes: 1. tAS is measured from the address valid to the beginning of Write. 2. A Write occurs during the overlap (tWP) of a low CE1 or high CE2 , and a low WE . 3. tWR is measured from the earliest of CE1 or WE going high or CE2 going low WE going high to the end of the Write cycle. 4. If the CE1 low or CE2 high transition occurs simultaneously with the WE low transition or after the WE transition, outputs remain in a high impedance state. 5. tCW is measured from the later of CE1 going low or CE2 going high to the end of Write. 6. OE level is high or low. 7. Transition is measured ±500mV from steady state. This parameter is sampled and not 100% tested. |
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