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SCANSTA111SMX Datasheet(PDF) 1 Page - Texas Instruments

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Part # SCANSTA111SMX
Description  SCANSTA111 Enhanced SCAN Bridge
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

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SCANSTA111
www.ti.com
SNLS060K – AUGUST 2001 – REVISED APRIL 2013
SCANSTA111 Enhanced SCAN Bridge
Multidrop Addressable IEEE 1149.1 (JTAG) Port
Check for Samples: SCANSTA111
1
FEATURES
DESCRIPTION
The SCANSTA111 extends the IEEE Std. 1149.1 test
2
True IEEE 1149.1 Hierarchical and Multidrop
bus into a multidrop test bus environment. The
Addressable Capability
advantage of a multidrop approach over a single
The 7 Slot Inputs Support Up to 121 Unique
serial scan chain is improved test throughput and the
Addresses, an Interrogation Address,
ability to remove a board from the system and retain
Broadcast Address, and 4 Multi-Cast Group
test
access
to
the
remaining
modules.
Each
Addresses (Address 000000 is Reserved)
SCANSTA111 supports up to 3 local IEEE 1149.1
scan rings which can be accessed individually or
3 IEEE 1149.1-Compatible Configurable Local
combined serially. Addressing is accomplished by
Scan Ports
loading the instruction register with a value matching
Mode Register0 Allows Local TAPs to be
that of the Slot inputs. Backplane and inter-board
Bypassed, Selected for Insertion Into the Scan
testing can easily be accomplished by parking the
Chain Individually, or Serially in Groups of
local TAP Controllers in one of the stable TAP
Two or Three
Controller states via a Park instruction. The 32-bit
TCK counter enables built in self test operations to be
Transparent Mode can be Enabled with a
performed on one port while other scan chains are
Single Instruction to Conveniently Buffer the
simultaneously tested.
Backplane IEEE 1149.1 Pins to those on a
Single Local Scan Port
LSP ACTIVE Outputs Provide Local Port
Enable Signals for Analog Busses Supporting
IEEE 1149.4.
General Purpose Local Port Pass-Through Bits
are Useful for Delivering Write Pulses for
FPGA Programming or Monitoring Device
Status.
Known Power-Up State
TRST on All Local Scan Ports
32-Bit TCK Counter
16-Bit LFSR Signature Compactor
Local TAPs can become TRI-STATE via the OE
Input to Allow an Alternate Test Master to Take
Control of the Local TAPs (LSP0-2 Have a TRI-
STATE Notification Output)
3.0-3.6V VCC Supply Operation
Power-Off High Impedance Inputs and Outputs
Supports Live Insertion/Withdrawal
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Copyright © 2001–2013, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.


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