STANDARD

MICROCIRCUIT DRAWING

SIZE

A

5962-93204

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990

REVISION LEVEL

B

SHEET

10

DSCC FORM 2234

APR 97

4.4.1 Group A inspection.

a.

Tests shall be as specified in table II herein.

b.

Subgroups 5, 6, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.

c.

Subgroup 4 shall be measured only for initial qualification and after any process or design changes which may affect

the parameter. Sample size is 15 devices with no failures, and all inputs tested.

TABLE II. Electrical test requirements.

Test requirements

Subgroups

(in accordance with

MIL-STD-883,

method 5005, table I)

Subgroups

(in accordance with

MIL-PRF-38535, table III)

Device

class M

Device

class Q

Device

class V

Interim electrical

parameters (see 4.2)

1, 7

1, 7

1, 7

Final electrical

parameters (see 4.2)

1, 2, 3, 4, 7, 8, 9

1/

1, 2, 3, 4, 7, 8, 9 1/

1, 2, 3, 4, 7, 8, 9 1/

Group A test

requirements (see 4.4)

1, 2, 3, 4, 7, 8, 9

1, 2, 3, 4, 7, 8, 9

1, 2, 3, 4, 7, 8, 9

Group C end-point electrical

parameters (see 4.4)

1

1

1, 2, 3, 4, 7, 8, 9

Group D end-point electrical

parameters (see 4.4)

1

1

1

Group E end-point electrical

parameters (see 4.4)

1

1

1

1/ PDA applies to subgroup 1.

4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein.

4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:

a.

Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level

control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the

inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of

MIL-STD-883.

b.

c.

Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.

4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,

or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The

test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the

inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-

883.