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DPO72504DX Datasheet(PDF) 8 Page - List of Unclassifed Manufacturers |
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DPO72504DX Datasheet(HTML) 8 Page - List of Unclassifed Manufacturers |
8 / 42 page TekExpress® PCI Express Gen 1/2/3 Automated Test Software (Option PCE3) - Provides the most comprehensive solution for PCI Express Gen 1/2/3 transmitter compliance testing as well as debug and validation of PCI Express devices against the PCI-SIG specifications. The application automates selection of appropriate fixture de- embed and reference channel emulation filters and measurement selections based on test type, device data rate, transmitter equalization, link width, and selected probes. In addition, the Option PCE3 application includes a TekExpress compliance automation solution that integrates the PCI-SIG's Sigtest test software with Tektronix' DPOJET- based PCI Express Jitter and Eye Diagram & SDLA Serial Data Link Analysis Visualizer analysis tools for debug. Results are presented in a comprehensive HTML format for engineering test documentation. TekExpress® MHL Advanced Analysis and Compliance Software (Option MHD) - Provides the most comprehensive solution for MHL 1.0/2.0/1.3/2.1 compliance testing as well as debug and validation of MHL devices against the latest MHL specifications. The application automates Transmitter, Sink and Dongle Electrical tests. Results are presented in a comprehensive HTML format for engineering test documentation Custom filter and de-embed capability Create your own filters or use the filters provided as standard with the MSO/DPO70000 Series to enhance your ability to isolate or remove a component of your signal (noise or specific harmonics of the signal). These customizable FIR filters can be used to implement signal-processing techniques, such as removing signal pre-emphasis or minimizing the effects of fixtures and cables connected to the device under test. Using the optional Serial Data Link Analysis Visualizer (SDLA64) application, you can gain further insight into serial data links with the capability to emulate the serial data channel from its S-parameters, remove reflections, cross- coupling, and loss caused by fixtures, cables, or probes, and open closed eyes caused by channel effects using receiver equalization techniques, such as CTLE, DFE, FFE. IBIS-AMI models for silicon-specific receiver equalization can used to observe on-chip behavior. SDLA - Serial Data Link Analysis Visualizer (Option SDLA64) – Offers the capability to emulate the serial data channel, de-embed fixtures, cables, or probes, and add or remove equalization. Option SDLA64 also provides processing of waveforms with IBIS- AMI Receiver Equalization, or CTLE, FFE and/or DFE equalization. DPOJET provides advanced measurement and jitter analysis of the resulting waveforms. Application-specific solutions – enable standard-specific certification, measurement automation, and extended signal analysis Accurate, Simple, and Customizable Physical Layer Certification Testing – For designers with industry-standard certification needs, standard-specific compliance and analysis modules that configure the pass/fail waveform mask and measurement limit testing are available as options on the MSO/ DPO70000 Series. Modules are available for PCI Express®, DDR Memory, Serial ATA, SAS, HDMI, Ethernet, DisplayPort, MIPI® D-PHY and M-PHY, Power Supplies, and USB. See the following list for highlights of the available application-specific solutions: Datasheet 8 www.tektronix.com |
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