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PZU3.6DB2DG Datasheet(PDF) 7 Page - NXP Semiconductors |
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PZU3.6DB2DG Datasheet(HTML) 7 Page - NXP Semiconductors |
7 / 12 page PZUXDB2_SER_1 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 01 — 31 March 2008 7 of 12 NXP Semiconductors PZUxDB2 series Dual Zener diodes 8. Test information 8.1 Quality information This product has been qualified in accordance with the Automotive Electronics Council (AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is suitable for use in automotive applications. Tj =25 °C PZU2.7DB2 to PZU6.2DB2 PZU2.7DB2/DG to PZU6.2DB2/DG Tj =25 °C PZU6.8DB2 to PZU24DB2 PZU6.8DB2/DG to PZU24DB2/DG Fig 5. Working current as a function of working voltage; typical values Fig 6. Working current as a function of working voltage; typical values 006aab217 10−1 10−2 10 1 102 IZ (mA) 10−3 VZ (V) 07 56 4 3 12 VZ(nom) (V) = 2.7 5.1 5.6 6.2 3.0 3.3 3.6 3.9 4.3 4.7 006aab218 10−1 10−2 10 1 102 IZ (mA) 10−3 VZ (V) 025 20 10 15 5 7.5 16 18 20 22 24 8.2 9.1 10 11 12 13 14 15 VZ(nom) (V) = 6.8 |
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