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74HCT373PW Datasheet(PDF) 17 Page - NXP Semiconductors |
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74HCT373PW Datasheet(HTML) 17 Page - NXP Semiconductors |
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17 / 26 page  74HC_HCT373 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved. Product data sheet Rev. 5 — 13 December 2011 17 of 26 NXP Semiconductors 74HC373; 74HCT373 Octal D-type transparent latch; 3-state Test data is given in Table 11. Definitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator CL = Load capacitance including jig and probe capacitance RL = Load resistor S1 = Test selection switch Fig 12. Test circuit for measuring switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aad983 DUT VCC VCC VI VO RT RL S1 CL open G Table 11. Test data Type Input Load S1 position VI tr, tf CL RL tPHL, tPLH tPZH, tPHZ tPZL, tPLZ 74HC373 VCC 6ns 15pF, 50 pF 1k open GND VCC 74HCT373 3 V 6 ns 15 pF, 50 pF 1 k open GND VCC |
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