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74HC273DB Datasheet(PDF) 12 Page - NXP Semiconductors |
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74HC273DB Datasheet(HTML) 12 Page - NXP Semiconductors |
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12 / 21 page 
74HC_HCT273 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved. Product data sheet Rev. 4 — 10 June 2013 12 of 21 NXP Semiconductors 74HC273; 74HCT273 Octal D-type flip-flop with reset; positive-edge trigger Test data is given in Table 9. Definitions for test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including jig and probe capacitance. RL = Load resistance. S1 = Test selection switch Fig 10. Test circuit for measuring switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aad983 DUT VCC VCC VI VO RT RL S1 CL open G Table 9. Test data Type Input Load S1 position VI tr, tf CL RL tPHL, tPLH 74HC273 VCC 6ns 15pF, 50 pF 1k open 74HCT273 3V 6ns 15pF, 50 pF 1k open |
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