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ADC12D1000 Datasheet(PDF) 22 Page - Texas Instruments |
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ADC12D1000 Datasheet(HTML) 22 Page - Texas Instruments |
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22 / 73 page  CIN, DIFF CIN, PIN-TO-GND CIN, PIN-TO-GND VIN+ VIN- ADC12D1000, ADC12D1600 SNAS480M – MAY 2010 – REVISED MARCH 2013 www.ti.com Figure 4. Specification Definitions APERTURE (SAMPLING) DELAY is the amount of delay, measured from the sampling edge of the CLK input, after which the signal present at the input pin is sampled inside the device. APERTURE JITTER (tAJ) is the variation in aperture delay from sample-to-sample. Aperture jitter can be effectively considered as noise at the input. CODE ERROR RATE (CER) is the probability of error and is defined as the probable number of word errors on the ADC output per unit of time divided by the number of words seen in that amount of time. A CER of 10-18 corresponds to a statistical error in one word about every 31.7 years for the ADC12D1000. CLOCK DUTY CYCLE is the ratio of the time that the clock waveform is at a logic high to the total time of one clock period. DIFFERENTIAL NON-LINEARITY (DNL) is the measure of the maximum deviation from the ideal step size of 1 LSB. It is measured at the relevant sample rate, fCLK, with fIN = 1MHz sine wave. EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE BITS) is another method of specifying Signal-to-Noise and Distortion Ratio, or SINAD. ENOB is defined as (SINAD − 1.76) / 6.02 and states that the converter is equivalent to a perfect ADC of this many (ENOB) number of bits. FULL POWER BANDWIDTH (FPBW) is a measure of the frequency at which the reconstructed output fundamental drops to 3 dB below its low frequency value for a full-scale input. GAIN ERROR is the deviation from the ideal slope of the transfer function. It can be calculated from Offset and Full-Scale Errors. The Positive Gain Error is the Offset Error minus the Positive Full-Scale Error. The Negative Gain Error is the Negative Full-Scale Error minus the Offset Error. The Gain Error is the Negative Full-Scale Error minus the Positive Full-Scale Error; it is also equal to the Positive Gain Error plus the Negative Gain Error. INTEGRAL NON-LINEARITY (INL) is a measure of worst case deviation of the ADC transfer function from an ideal straight line drawn through the ADC transfer function. The deviation of any given code from this straight line is measured from the center of that code value step. The best fit method is used. INTERMODULATION DISTORTION (IMD) is a measure of the near-in 3rd order distortion products (2f2 - f1, 2f1 - f2) which occur when two tones which are close in frequency (f1, f2) are applied to the ADC input. It is measured from the input tones level to the higher of the two distortion products (dBc) or simply the level of the higher of the two distortion products (dBFS). The input tones are typically -7dBFS. LSB (LEAST SIGNIFICANT BIT) is the bit that has the smallest value or weight of all bits. This value is VFS / 2 N (1) where VFS is the differential full-scale amplitude VIN_FSR as set by the FSR input and "N" is the ADC resolution in bits, which is 10 for the ADC12D1000/1600. 22 Submit Documentation Feedback Copyright © 2010–2013, Texas Instruments Incorporated Product Folder Links: ADC12D1000 ADC12D1600 |
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