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SN65472DEP Datasheet(PDF) 5 Page - Texas Instruments |
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SN65472DEP Datasheet(HTML) 5 Page - Texas Instruments |
5 / 13 page 1000 10000 100000 1000000 80 85 90 95 100 105 110 115 120 125 130 135 140 145 150 Junction Temperature (°C) Wirebond Voiding Fail Mode SN65472-EP www.ti.com SLRS061 – SEPTEMBER 2013 (1) See Datasheet for Absolute Maximum and minimum Recommended Operating Conditions. (2) Silicon operating life design goal is 10 years at 105°C junction temperature (does not include package interconnect life). Figure 1. SN65472-EP Wirebond Life Derating Chart Copyright © 2013, Texas Instruments Incorporated Submit Documentation Feedback 5 Product Folder Links: SN65472-EP |
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