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TLP708F Datasheet(PDF) 5 Page - Toshiba Semiconductor |
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TLP708F Datasheet(HTML) 5 Page - Toshiba Semiconductor |
5 / 13 page TLP708,TLP708F 2012-08-07 5 TEST CIRCUIT 5: tpHL, tpLH Test Circuit TEST CIRCUIT 6: Common-Mode Transient Immunity Test Circuit VO VOL tpLH tpHL 1.5 V 50% tf tr 90% 10% IF 0.1μF RIN=100Ω *CL=15pF *CL=15pF RL=350Ω IF=7.5mA(P.G.) (f=5MHz , duty=50%, tr=tf=4.5ns) IF monitor VO P.G. SHIELD C L includes probe and stray capacitance. P.G.: Pulse generator VCC 1 2 3 6 5 4 VCM 10% 90% 1000 V ・ SW B : IF=0 mA ・ SW A : IF=10 mA 0.8 V 2V VO tr tf CML CMH + - SW B VCC VCM VO 0.1 μF IF A RL=350Ω → ) ( ) ( 800 s t r V H CM μ = ) ( ) ( 800 s t f V L CM μ − = 1 2 3 6 5 4 |
Similar Part No. - TLP708F |
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Similar Description - TLP708F |
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