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74HCT74D-T Datasheet(PDF) 12 Page - NXP Semiconductors |
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74HCT74D-T Datasheet(HTML) 12 Page - NXP Semiconductors |
12 / 21 page ![]() 74HC_HCT74 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved. Product data sheet Rev. 4 — 27 August 2012 12 of 21 NXP Semiconductors 74HC74; 74HCT74 Dual D-type flip-flop with set and reset; positive edge-trigger Test data is given in Table 10. Definitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including jig and probe capacitance. RL = Load resistance. S1 = Test selection switch. Fig 9. Test circuit for measuring switching times 001aah768 tW tW tr tr tf VM VI negative pulse GND VI positive pulse GND 10 % 90 % 90 % 10 % VM VM VM tf VCC DUT RT VI VO CL G Table 10. Test data Type Input Load Test VI tr, tf CL RL 74HC74 VCC 6ns 15pF, 50 pF 1k tPLH, tPHL 74HCT74 3V 6ns 15pF, 50 pF 1k tPLH, tPHL |
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