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74HC595D Datasheet(PDF) 15 Page - NXP Semiconductors |
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74HC595D Datasheet(HTML) 15 Page - NXP Semiconductors |
15 / 24 page 74HC_HCT595 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved. Product data sheet Rev. 6 — 12 December 2011 15 of 24 NXP Semiconductors 74HC595; 74HCT595 8-bit serial-in, serial or parallel-out shift register with output latches; 3-state Test data is given in Table 9. Definitions for test circuit: CL = load capacitance including jig and probe capacitance. RL = load resistance. RT = termination resistance should be equal to the output impedance Zo of the pulse generator. S1 = test selection switch. Fig 14. Test circuit for measuring switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aad983 DUT VCC VCC VI VO RT RL S1 CL open G Table 9. Test data Type Input Load S1 position VI tr, tf CL RL tPHL, tPLH tPZH, tPHZ tPZL, tPLZ 74HC595 VCC 6 ns 50 pF 1 k open GND VCC 74HCT595 3 V 6 ns 50 pF 1 k open GND VCC |
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