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5962R8853801VGA Datasheet(PDF) 6 Page - List of Unclassifed Manufacturers

Part # 5962R8853801VGA
Description  MICROCIRCUIT, LINEAR, DUAL PRECISION JFET-INPUT OPERATIONAL AMPLIFIERS MONOLITHIC SILICON
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Manufacturer  ETC2 [List of Unclassifed Manufacturers]
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STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-88538
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
G
SHEET
6
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics – Continued.
Test
Symbol
Conditions 1/ 2/
-55
C  TA  +125C
VS = 15 V
Group A
subgroups
Device
type
Limits
Unit
unless otherwise specified
Min
Max
Slew rate 4/
SR
AVCL = +1, RL  2 k,
4
01,04
10.0
V/
s
CL = 100 pF
5,6
7.5
4
02,03
7.5
5,6
5.0
Settling time 4/ 5/
tS
To 0.01 %, TA = +25C
9
All
3.0
s
To 0.05 %, TA = +25C
2.1
To 0.10 %, TA = +25C
1.8
Common-mode 4/
rejection ratio
CMRR
VCM = IVR = 10.2 V
1
All
86
dB
2,3
82
Power supply rejection 4/
ratio
PSRR
VS = 10 V to 16 V
1
01,04
51
V/V
02,03
80
2,3
All
100
Input voltage range 4/ 6/
IVR
1,2,3
All
10.2
V
Gain bandwidth 4/ 7/
product
ABW
TA = +25C
4
All
3.5
MHz
1/
RHA devices supplied to this drawing have been characterized through all levels M, D, P, L, and R of irradiation.
However, this device is only tested at the “R” level. Pre and Post irradiation values are identical unless otherwise specified
in Table I. When performing post irradiation electrical measurements for any RHA level, TA = +25C.
2/
These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects.
Radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883,
method 1019, condition A.
3/
TA = -55C for IIO and IIB tests, subgroup 3, is guaranteed by TA = +25C test.
4/
This parameter not tested post radiation.
5/
Settling time is defined here for a unity gain inverter connection using 2 k
 resistors. It is the time required for the error
voltage (the voltage at the inverting input pin on the amplifier) to settle to within a specified percent of its final value from
the time a 10 V step input is applied to the inverter.
6/
IVR test is defined as the VCM range used for the CMRR test.
7/
Parameter guaranteed if not tested to the limits specified.


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