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EPF10K50V Datasheet(PDF) 44 Page - Altera Corporation |
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EPF10K50V Datasheet(HTML) 44 Page - Altera Corporation |
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44 / 128 page  44 Altera Corporation FLEX 10K Embedded Programmable Logic Device Family Data Sheet Generic Testing Each FLEX 10K device is functionally tested. Complete testing of each configurable SRAM bit and all logic functionality ensures 100% yield. AC test measurements for FLEX 10K devices are made under conditions equivalent to those shown in Figure 19. Multiple test patterns can be used to configure devices during all stages of the production flow. Figure 19. FLEX 10K AC Test Conditions Operating Conditions Tables 17 through 21 provide information on absolute maximum ratings, recommended operating conditions, DC operating conditions, and capacitance for 5.0-V FLEX 10K devices. VCC To Test System C1 (includes JIG capacitance) Device input rise and fall times < 3 ns Device Output 250 Ω (8.06 k Ω) [481 Ω] 464 Ω (703 Ω) [521 Ω] Power supply transients can affect AC measurements. Simultaneous transitions of multiple outputs should be avoided for accurate measurement. Threshold tests must not be performed under AC conditions. Large-amplitude, fast-ground-current transients normally occur as the device outputs discharge the load capacitances. When these transients flow through the parasitic inductance between the device ground pin and the test system ground, significant reductions in observable noise immunity can result. Numbers without parentheses are for 5.0-V devices or outputs. Numbers in parentheses are for 3.3-V devices or outputs. Numbers in brackets are for 2.5-V devices or outputs. Table 17. FLEX 10K 5.0-V Device Absolute Maximum Ratings Note (1) Symbol Parameter Conditions Min Max Unit VCC Supply voltage With respect to ground (2) –2.0 7.0 V VI DC input voltage –2.0 7.0 V IOUT DC output current, per pin –25 25 mA TSTG Storage temperature No bias –65 150 ° C TAMB Ambient temperature Under bias –65 135 ° C TJ Junction temperature Ceramic packages, under bias 150 ° C PQFP, TQFP, RQFP, and BGA packages, under bias 135 ° C |
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