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LP2998MRE Datasheet(PDF) 3 Page - Texas Instruments |
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LP2998MRE Datasheet(HTML) 3 Page - Texas Instruments |
3 / 26 page LP2998 www.ti.com SNVS521I – DECEMBER 2007 – REVISED APRIL 2013 Absolute Maximum Ratings (1) (2) AVIN to GND −0.3V to +6V PVIN to GND -0.3V to AVIN VDDQ (3) −0.3V to +6V Storage Temp. Range −65°C to +150°C Junction Temperature 150°C Lead Temperature (Soldering, 10 sec) 260°C SOIC-8 Thermal Resistance ( θJA) 151°C/W SO PowerPAD-8 Thermal Resistance ( θJA) 43°C/W Minimum ESD Rating (4) 1kV (1) Absolute maximum ratings indicate limits beyond which damage to the device may occur. Operating range indicates conditions for which the device is intended to be functional, but does not ensure specific performance limits. For ensured specifications and test conditions see Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. (2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and specifications. (3) VDDQ voltage must be less than 2 x (AVIN - 1) or 6V, whichever is smaller. (4) The human body model is a 100 pF capacitor discharged through a 1.5 k Ω resistor into each pin. Operating Range Junction Temp. Range (1) -40°C to +125°C AVIN to GND 2.2V to 5.5V (1) At elevated temperatures, devices must be derated based on thermal resistance. The device in the SOIC-8 package must be derated at θJA = 151.2° C/W junction to ambient with no heat sink. Electrical Characteristics Specifications with standard typeface are for TJ = 25°C and limits in boldface type apply over the full Operating Temperature Range (TJ = -40°C to +125°C) (1). Unless otherwise specified, VIN = AVIN = PVIN = 2.5V. Parameter Test Conditions Min Typ Max Units VREF Voltage (DDR I) VIN = VDDQ = 2.3V 1.135 1.158 1.185 V VIN = VDDQ = 2.5V 1.235 1.258 1.285 V VIN = VDDQ = 2.7V 1.335 1.358 1.385 V VREF Voltage (DDR II) PVIN = VDDQ = 1.7V 0.837 0.860 0.887 V VREF PVIN = VDDQ = 1.8V 0.887 0.910 0.937 V PVIN = VDDQ = 1.9V 0.936 0.959 0.986 V VREF Voltage (DDR III) PVIN = VDDQ = 1.35V 0.669 0.684 0.699 V PVIN = VDDQ = 1.5V 0.743 0.758 0.773 V PVIN = VDDQ = 1.6V 0.793 0.808 0.823 V ZVREF VREF Output Impedance IREF = -30 to +30 µA 2.5 k Ω (1) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlation using Statistical Quality Control (SQC) methods. The limits are used to calculate Average Outgoing Quality Level (AOQL). Copyright © 2007–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: LP2998 |
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