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LP2998MRE Datasheet(PDF) 3 Page - Texas Instruments

Part # LP2998MRE
Description  LP2998 DDR-I and DDR-II Termination Regulator
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

LP2998MRE Datasheet(HTML) 3 Page - Texas Instruments

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LP2998
www.ti.com
SNVS521I – DECEMBER 2007 – REVISED APRIL 2013
Absolute Maximum Ratings
(1) (2)
AVIN to GND
−0.3V to +6V
PVIN to GND
-0.3V to AVIN
VDDQ (3)
−0.3V to +6V
Storage Temp. Range
−65°C to +150°C
Junction Temperature
150°C
Lead Temperature (Soldering, 10 sec)
260°C
SOIC-8 Thermal Resistance (
θJA)
151°C/W
SO PowerPAD-8 Thermal Resistance (
θJA)
43°C/W
Minimum ESD Rating (4)
1kV
(1)
Absolute maximum ratings indicate limits beyond which damage to the device may occur. Operating range indicates conditions for which
the device is intended to be functional, but does not ensure specific performance limits. For ensured specifications and test conditions
see Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may
degrade when the device is not operated under the listed test conditions.
(2)
If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and
specifications.
(3)
VDDQ voltage must be less than 2 x (AVIN - 1) or 6V, whichever is smaller.
(4)
The human body model is a 100 pF capacitor discharged through a 1.5 k
Ω resistor into each pin.
Operating Range
Junction Temp. Range (1)
-40°C to +125°C
AVIN to GND
2.2V to 5.5V
(1)
At elevated temperatures, devices must be derated based on thermal resistance. The device in the SOIC-8 package must be derated at
θJA = 151.2° C/W junction to ambient with no heat sink.
Electrical Characteristics
Specifications with standard typeface are for TJ = 25°C and limits in boldface type apply over the full Operating
Temperature Range (TJ = -40°C to +125°C)
(1). Unless otherwise specified, VIN = AVIN = PVIN = 2.5V.
Parameter
Test Conditions
Min
Typ
Max
Units
VREF Voltage (DDR I)
VIN = VDDQ = 2.3V
1.135
1.158
1.185
V
VIN = VDDQ = 2.5V
1.235
1.258
1.285
V
VIN = VDDQ = 2.7V
1.335
1.358
1.385
V
VREF Voltage (DDR II)
PVIN = VDDQ = 1.7V
0.837
0.860
0.887
V
VREF
PVIN = VDDQ = 1.8V
0.887
0.910
0.937
V
PVIN = VDDQ = 1.9V
0.936
0.959
0.986
V
VREF Voltage (DDR III)
PVIN = VDDQ = 1.35V
0.669
0.684
0.699
V
PVIN = VDDQ = 1.5V
0.743
0.758
0.773
V
PVIN = VDDQ = 1.6V
0.793
0.808
0.823
V
ZVREF
VREF Output Impedance
IREF = -30 to +30 µA
2.5
k
(1)
Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlation using
Statistical Quality Control (SQC) methods. The limits are used to calculate Average Outgoing Quality Level (AOQL).
Copyright © 2007–2013, Texas Instruments Incorporated
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