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NDB7060L Datasheet(PDF) 1 Page - Fairchild Semiconductor |
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NDB7060L Datasheet(HTML) 1 Page - Fairchild Semiconductor |
1 / 6 page June 1996 NDP7060L / NDB7060L N-Channel Logic Level Enhancement Mode Field Effect Transistor General Description Features ________________________________________________________________________________ Absolute Maximum Ratings T C = 25°C unless otherwise noted Symbol Parameter NDP7060L NDB7060L Units V DSS Drain-Source Voltage 60 V V DGR Drain-Gate Voltage (R GS < 1 MΩ) 60 V V GSS Gate-Source Voltage - Continuous ± 20 V - Nonrepetitive (t P < 50 µs) ± 40 I D Drain Current - Continuous 75 A - Pulsed 225 P D Total Power Dissipation @ T C = 25°C 150 W Derate above 25°C 1 W/°C T J,TSTG Operating and Storage Temperature Range -65 to 175 °C NDP7060L Rev. B2 / NDB7060L Rev. C S D G 75A, 60V. R DS(ON) = 0.015Ω @ VGS = 5V Low drive requirements allowing operation directly from logic drivers. V GS(TH) < 2.0V. Critical DC electrical parameters specified at elevated temperature. Rugged internal source-drain diode can eliminate the need for an external Zener diode transient suppressor. 175°C maximum junction temperature rating. High density cell design for extremely low R DS(ON). TO-220 and TO-263 (D 2PAK) package for both through hole and surface mount applications. These logic level N-Channel enhancement mode power field effect transistors are produced using Fairchild's proprietary, high cell density, DMOS technology. This very high density process has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulses in the avalanche and commutation modes. These devices are particularly suited for low voltage applications such as automotive, DC/DC converters, PWM motor controls, and other battery powered circuits where fast switching, low in-line power loss, and resistance to transients are needed. © 1997 Fairchild Semiconductor Corporation |
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