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INA199B2 Datasheet(PDF) 2 Page - Texas Instruments |
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INA199B2 Datasheet(HTML) 2 Page - Texas Instruments |
2 / 28 page INA199A1, INA199B1 INA199A2, INA199B2 INA199A3, INA199B3 SBOS469D – MAY 2009 – REVISED NOVEMBER 2012 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGE INFORMATION(1) PACKAGE PRODUCT GAIN PACKAGE-LEAD DESIGNATOR PACKAGE MARKING SC70-6 DCK OBG INA199A1 50V/V Thin QFN-10 RSW NSJ SC70-6 DCK SEB INA199B1 50V/V Thin QFN-10 RSW SHV SC70-6 DCK OBH INA199A2 100V/V Thin QFN-10 RSW NTJ SC70-6 DCK SEG INA199B2 100V/V Thin QFN-10 RSW SHW SC70-6 DCK OBI INA199A3 200V/V Thin QFN-10 RSW NUJ SC70-6 DCK SHE INA199B3 200V/V Thin QFN-10 RSW SHX (1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. ABSOLUTE MAXIMUM RATINGS (1) Over operating free-air temperature range, unless otherwise noted. VALUE UNIT Supply Voltage +26 V Differential (VIN+) – (VIN–) –26 to +26 V Analog Inputs, VIN+, VIN– (2) Common-mode(3) GND – 0.3 to +26 V REF Input GND – 0.3 to (V+) + 0.3 V Output(3) GND – 0.3 to (V+) + 0.3 V Input Current Into All Pins(3) 5 mA Operating Temperature –40 to +125 °C Storage Temperature –65 to +150 °C Junction Temperature +150 °C Human Body Model (HBM) 4000 V ESD Ratings: Charged-Device Model (CDM) 1000 V (version A) Machine Model (MM) 200 V Human Body Model (HBM) 1500 V ESD Ratings: Charged-Device Model (CDM) 1000 V (version B) Machine Model (MM) 100 V (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not implied. (2) VIN+ and VIN– are the voltages at the IN+ and IN– pins, respectively. (3) Input voltage at any pin may exceed the voltage shown if the current at that pin is limited to 5mA. 2 Submit Documentation Feedback Copyright © 2009–2012, Texas Instruments Incorporated Product Folder Links: INA199A1 INA199B1 INA199A2 INA199B2 INA199A3 INA199B3 |
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