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TS5A3157DBVRE4 Datasheet(PDF) 13 Page - Texas Instruments

Part # TS5A3157DBVRE4
Description  10OHM SPDT ANALOG SWITCH
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
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TS5A3157DBVRE4 Datasheet(HTML) 13 Page - Texas Instruments

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TS5A3157
10-
Ω SPDT ANALOG SWITCH
SCDS219A – NOVEMBER 2005 – REVISED OCTOBER 2007
PIN DESCRIPTION
PIN NO.
NAME
DESCRIPTION
1
NO
Normally open
2
GND
Digital ground
3
NC
Normally closed
4
COM
Common
5
V+
Power supply
6
IN
Digital control to connect the COM to NO or NC
PARAMETER DESCRIPTION
SYMBOL
DESCRIPTION
VCOM
Voltage at COM
VNC
Voltage at NC
VNO
Voltage at NO
ron
Resistance between COM and NC or COM and NO ports when the channel is ON
Δron
Difference of ron between channels in a specific device
ron(flat)
Difference between the maximum and minimum value of ron in a channel over the specified range of conditions
INC(OFF)
Leakage current measured at the NC port, with the corresponding channel (NC to COM) in the OFF state
INO(OFF)
Leakage current measured at the NO port, with the corresponding channel (NO to COM) in the OFF state
Leakage current measured at the NC port, with the corresponding channel (NC to COM) in the ON state and the output
INC(ON)
(COM) open
Leakage current measured at the NO port, with the corresponding channel (NO to COM) in the ON state and the output
INO(ON)
(COM) open
Leakage current measured at the COM port, with the corresponding channel (COM to NO or COM to NC) in the ON state and
ICOM(ON)
the output (NC or NO) open
VIH
Minimum input voltage for logic high for the control input (IN)
VIL
Maximum input voltage for logic low for the control input (IN)
VI
Voltage at the control input (IN)
IIH, IIL
Leakage current measured at the control input (IN)
Turn-on time for the switch. This parameter is measured under the specified range of conditions and by the propagation delay
tON
between the digital control (IN) signal and analog output (COM, NC, or NO) signal when the switch is turning ON.
Turn-off time for the switch. This parameter is measured under the specified range of conditions and by the propagation delay
tOFF
between the digital control (IN) signal and analog output (COM, NC, or NO) signal when the switch is turning OFF.
Break-before-make time. This parameter is measured under the specified range of conditions and by the propagation delay
tBBM
between the output of two adjacent analog channels (NC and NO) when the control signal changes state.
Charge injection is a measurement of unwanted signal coupling from the control (IN) input to the analog (NC, NO, or COM)
QC
output. This is measured in coulomb (C) and measured by the total charge induced due to switching of the control input.
Charge injection, QC = CL × ΔVCOM, CL is the load capacitance and ΔVCOM is the change in analog output voltage.
CNC(OFF)
Capacitance at the NC port when the corresponding channel (NC to COM) is OFF
CNO(OFF)
Capacitance at the NO port when the corresponding channel (NO to COM) is OFF
CNC(ON)
Capacitance at the NC port when the corresponding channel (NC to COM) is ON
CNO(ON)
Capacitance at the NO port when the corresponding channel (NO to COM) is ON
CCOM(ON)
Capacitance at the COM port when the corresponding channel (COM to NC or COM to NO) is ON
CI
Capacitance of control input (IN)
OFF isolation of the switch is a measurement of OFF-state switch impedance. This is measured in dB in a specific frequency,
OISO
with the corresponding channel (NC to COM or NO to COM) in the OFF state.
Crosstalk is a measurement of unwanted signal coupling from an ON channel to an OFF channel (NC to NO or NO to NC).
XTALK
This is measured in a specific frequency and in dB.
BW
Bandwidth of the switch. This is the frequency where the gain of an ON channel is –3 dB below the DC gain.
Total harmonic distortion describes the signal distortion caused by the analog switch. This is defined as the ratio of root mean
THD
square (RMS) value of the second, third, and higher harmonic to the absolute magnitude of fundamental harmonic.
I+
Static power-supply current with the control (IN) pin at V+ or GND
Copyright © 2005–2007, Texas Instruments Incorporated
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