CC2541

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SWRS110D – JANUARY 2012 – REVISED JUNE 2013

32.768-kHz CRYSTAL OSCILLATOR

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Crystal frequency

32.768

kHz

–40

40

ppm

ESR

Equivalent series resistance

40

130

k

Ω

Crystal shunt capacitance

0.9

2

pF

Crystal load capacitance

12

16

pF

Start-up time

0.4

s

(1)

Including aging and temperature dependency, as specified by [1]

32-kHz RC OSCILLATOR

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

32.753

kHz

Frequency accuracy after calibration

±0.2%

0.4

%/°C

3

%/V

2

ms

(1)

The calibrated 32-kHz RC oscillator frequency is the 32-MHz XTAL frequency divided by 977.

(2)

Frequency drift when temperature changes after calibration

(3)

Frequency drift when supply voltage changes after calibration

(4)

When the 32-kHz RC oscillator is enabled, it is calibrated when a switch from the 16-MHz RC oscillator to the 32-MHz crystal oscillator

is performed while SLEEPCMD.OSC32K_CALDIS is set to 0.

16-MHz RC OSCILLATOR

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

16

MHz

Uncalibrated frequency accuracy

±18%

Calibrated frequency accuracy

±0.6%

Start-up time

10

μs

50

μs

(1)

The calibrated 16-MHz RC oscillator frequency is the 32-MHz XTAL frequency divided by 2.

(2)

When the 16-MHz RC oscillator is enabled, it is calibrated when a switch from the 16-MHz RC oscillator to the 32-MHz crystal oscillator

is performed while SLEEPCMD.OSC_PD is set to 0.

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