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RS7100-285NG Datasheet(PDF) 1 Page - Orister Corporation

Part # RS7100-285NG
Description  Low Power 300mA CMOS LDO
Download  12 Pages
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Manufacturer  ORISTER [Orister Corporation]
Direct Link  http://www.orister.com
Logo ORISTER - Orister Corporation

RS7100-285NG Datasheet(HTML) 1 Page - Orister Corporation

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DS‐RS7100‐14   April, 2010 
www.Orister.com
RS7100 
Low Power 300mA CMOS LDO 
 
General Description 
The RS7100 is a low‐dropout linear regulator that operations in the input voltage range from +2.5V to +9.0V and delivers 
300mA  output  current.  The  high‐accuracy  output  voltage  is  preset  at  an  internally  trimmed  voltage  2.5V  or  3.3V.  Other 
output voltages can be mask‐optioned from 1.5V to 5.0V with 100mV increment. 
 
The  RS7100  consists  of  a  1.25V  bandgap  reference,  an  error  amplifier,  and  a  P‐channel  pass  transistor.  Other  features 
include short‐circuit protection and thermal shutdown protection. The RS7100 devices are available in SOT‐23 and SOT‐89 
packages.
 
Features 
Applications 
● Operating Voltages Range: +2.5V to +9.0V 
● Output Voltages Range: +1.5V to +5.0V with 100mV 
Increment 
● Maximum Output Current: 300mA 
● Low Dropout: 120mV@100mA (VOUT≥2.0V) 
● ±2% Output Voltage Accuracy 
● High Ripple Rejection: 70dB 
● Output Current Limit Protection (600mA) 
● Short Circuit Protection (300mA) 
● Thermal Overload Shutdown Protection 
● Low ESR Capacitor Compatible 
● RoHS Compliant and 100% Lead (Pb)‐Free and Green 
(Halogen Free with Commercial Standard) 
● Battery‐powered equipment 
● Voltage regulator for microprocessor 
● Voltage regulator for LAN cards 
● Wireless Communication equipment 
● Audio/Video equipment 
● Post Regulator for Switching Power 
Application Circuits 
 
 
 
 
 
 
 
 
 
This  integrated  circuit  can  be  damaged  by  ESD.  Orister  Corporation  recommends  that  all  integrated  circuits  be  handled  with 
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. 
 
ESD  damage  can  range  from  subtle  performance  degradation  to  complete  device  failure.  Precision  integrated  circuits  may  be  more 
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
 


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